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"yeh cf"的相关文件
显示项目 66-90 / 119 (共5页)
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| 國立交通大學 |
2014-12-08T15:25:48Z |
Fabrication of thin-film transistors on plastic substrates by spin etching and device transfer process
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Wang, SC; Hsu, CT; Yeh, CF; Lou, JC |
| 國立交通大學 |
2014-12-08T15:25:27Z |
A new observation of the germanium outdiffusion effect on the hot carrier and NBTI reliabilities in sub-100nm technology strained-Si/SiGe CMOS devices
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Chung, SS; Liu, YR; Yeh, CF; Wu, SR; Lai, CS; Chang, TY; Ho, JH; Liu, CY; Huang, CT; Tsai, CT; Shiau, WT; Sun, SW |
| 國立交通大學 |
2014-12-08T15:18:03Z |
Pentacene-based thin film transistors used to drive a twist-nematic liquid crystal display
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Wang, YW; Cheng, HL; Wang, YK; Hu, TH; Ho, JC; Lee, CC; Lei, TF; Yeh, CF |
| 國立交通大學 |
2014-12-08T15:05:01Z |
INVESTIGATION OF THERMAL COEFFICIENT FOR POLYCRYSTALLINE SILICON THERMAL SENSOR DIODE
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YEH, CF; LIN, SS; YANG, GP |
| 國立交通大學 |
2014-12-08T15:04:55Z |
THE NOVEL PREPARATION OF P-N-JUNCTION MESA DIODES BY SILICON-WAFER DIRECT BONDING (SDB)
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YEH, CF; SHYANG, HL |
| 國立交通大學 |
2014-12-08T15:04:47Z |
THE EFFECT OF TEMPERATURE ON I-V-CHARACTERISTICS OF A-SI-H PHOTODIODE
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CHANG, KL; YEH, CF |
| 國立交通大學 |
2014-12-08T15:04:31Z |
THE CHARACTERIZATION OF AL2O3 PREPARED BY ANODIC-OXIDATION
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YEH, CF; CHENG, JY; LU, JH |
| 國立交通大學 |
2014-12-08T15:04:25Z |
NOVEL TECHNIQUE FOR SIO2 FORMED BY LIQUID-PHASE DEPOSITION FOR LOW-TEMPERATURE PROCESSED POLYSILICON TFT
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YEH, CF; LIN, SS; CHEN, CL; YANG, YC |
| 國立交通大學 |
2014-12-08T15:04:20Z |
EXPERIMENTAL COMPARISON OF OFF-STATE CURRENT BETWEEN HIGH-TEMPERATURE-PROCESSED AND LOW-TEMPERATURE-PROCESSED UNDOPED CHANNEL POLYSILICON THIN-FILM TRANSISTORS
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YEH, CF; YANG, TZ; CHEN, CL; CHEN, TJ; YANG, YC |
| 國立交通大學 |
2014-12-08T15:04:20Z |
INVESTIGATION OF SI-SIO2 INTERFACE PROPERTIES FOR BONDED SILICON-ON-INSULATOR
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YEH, CF; KAO, HW; CHANG, BS; CHANG, KL |
| 國立交通大學 |
2014-12-08T15:04:13Z |
IMPROVED IV-CHARACTERISTICS OF POLYSILICON THIN-FILM TRANSISTORS WITH NOVEL DUAL-BUFFER DRAIN STRUCTURE
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YEH, CF; CHERN, CH |
| 國立交通大學 |
2014-12-08T15:04:07Z |
PERFORMANCE AND OFF-STATE CURRENT MECHANISMS OF LOW-TEMPERATURE PROCESSED POLYSILICON THIN-FILM TRANSISTORS WITH LIQUID-PHASE DEPOSITED SIO2 GATE INSULATOR
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YEH, CF; LIN, SS; YANG, TZ; CHEN, CL; YANG, YC |
| 國立交通大學 |
2014-12-08T15:04:04Z |
LOW-TEMPERATURE-PROCESSED POLY-SI THIN-FILM TRANSISTORS USING SOLID-PHASE-CRYSTALLIZED AND LIQUID-PHASE-DEPOSITED GATE OXIDE
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YEH, CF; CHEN, CL; YANG, YC; LIN, SS; YANG, TZ; HONG, TY |
| 國立交通大學 |
2014-12-08T15:03:56Z |
ROOM-TEMPERATURE SELECTIVE GROWTH OF DIELECTRIC FILMS BY LIQUID-PHASE DEPOSITION
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YEH, CF; CHEN, CL |
| 國立交通大學 |
2014-12-08T15:03:43Z |
THE PHYSICOCHEMICAL PROPERTIES AND GROWTH-MECHANISM OF OXIDE (SIO2-XFX) BY LIQUID-PHASE DEPOSITION WITH H2O ADDITION ONLY
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YEH, CF; CHEN, CL; LIN, GH |
| 國立交通大學 |
2014-12-08T15:03:33Z |
CHARACTERISTICS OF SELF-INDUCED LIGHTLY-DOPED-DRAIN POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS WITH LIQUID-PHASE DEPOSITION SIO2 AS GATE-INSULATOR AND PASSIVATION-LAYER
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YEH, CF; YANG, TZ; CHEN, TJ |
| 國立交通大學 |
2014-12-08T15:03:31Z |
BOND-STRUCTURE CHANGES OF LIQUID-PHASE DEPOSITED OXIDE (SIO2-XFX) ON N2 ANNEALING
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YEH, CF; CHEN, CL; LUR, W; YEN, PW |
| 國立交通大學 |
2014-12-08T15:03:22Z |
FABRICATION OF MOSFETS USING LOW-TEMPERATURE LIQUID-PHASE DEPOSITED OXIDE
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YEH, CF; LIN, SS; HONG, TY |
| 國立交通大學 |
2014-12-08T15:03:17Z |
LOW-TEMPERATURE PROCESSED MOSFETS WITH LIQUID-PHASE DEPOSITED SIO2-XFX AS GATE INSULATOR
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YEH, CF; LIN, SS; HONG, TY |
| 國立交通大學 |
2014-12-08T15:03:16Z |
EFFECTS OF PLASMA TREATMENT ON THE PROPERTIES OF ROOM-TEMPERATURE LIQUID-PHASE DEPOSITED (LPD) OXIDE-FILMS
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YEH, CF; LIN, SS |
| 國立交通大學 |
2014-12-08T15:03:11Z |
CHARACTERIZATION OF THE CHEMICAL-MECHANICAL POLISHING PROCESS-BASED ON NANOINDENTATION MEASUREMENT OF DIELECTRIC FILMS
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LIU, CW; DAI, BT; YEH, CF |
| 國立交通大學 |
2014-12-08T15:03:10Z |
CONTROLLING FLUORINE CONCENTRATION AND THERMAL ANNEALING EFFECT ON LIQUID-PHASE DEPOSITED SIO2-XFX FILMS
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YEH, CF; CHEN, CL |
| 國立交通大學 |
2014-12-08T15:03:07Z |
THINNER LIQUID-PHASE DEPOSITED OXIDE FOR POLYSILICON THIN-FILM TRANSISTORS
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YEH, CF; LIN, SS; FAN, CL |
| 國立交通大學 |
2014-12-08T15:03:02Z |
Chemical mechanical polishing of PSG and BPSG dielectric films: The effect of phosphorus and boron concentration
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Liu, CW; Dai, BT; Yeh, CF |
| 國立交通大學 |
2014-12-08T15:02:52Z |
Modeling of the wear mechanism during chemical-mechanical polishing
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Liu, CW; Dai, BT; Tseng, WT; Yeh, CF |
显示项目 66-90 / 119 (共5页)
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