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"yeh cf"的相關文件
顯示項目 56-65 / 119 (共12頁)
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| 國立交通大學 |
2014-12-08T15:27:33Z |
A physically-based built-in Spice Poly-Si TFT model for circuit simulation and reliability evaluation
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Chung, SS; Chen, DC; Cheng, CT; Yeh, CF |
| 國立交通大學 |
2014-12-08T15:27:30Z |
Passivation effects of ion plating capping oxide on poly-Si TFTs
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Yeh, CF; Chen, TJ; Kao, JS |
| 國立交通大學 |
2014-12-08T15:27:24Z |
In-situ O-2-plasma passivation effect on poly-Si TFTs during ion plating capping oxide
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Yeh, CF; Chen, TJ; Lin, MT; Kao, JS |
| 國立交通大學 |
2014-12-08T15:27:24Z |
Effect of processing temperature on polysilicon thin-film transistors with liquid-phase deposited oxide as gate insulator
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Yeh, CF; Chen, TJ; Jeng, JN |
| 國立交通大學 |
2014-12-08T15:27:15Z |
Applying selective liquid-phase deposition to create contact holes in plasma damage-free process
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Yeh, CF; Liu, CH |
| 國立交通大學 |
2014-12-08T15:27:14Z |
Newly developed low-K and low-stress fluorinated silicon oxide utilizing temperature-difference liquid-phase deposition technology
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Yeh, CF; Lee, YC; Lee, SC |
| 國立交通大學 |
2014-12-08T15:27:13Z |
Highly reliable liquid-phase deposited SiO2 with nitrous oxide plasma post-treatment for low temperature processed poly-Si TFT's
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Yeh, CF; Chen, DC; Lu, CY; Liu, C; Lee, ST; Liu, CH; Chen, TJ |
| 國立交通大學 |
2014-12-08T15:27:06Z |
O-2-plasma degradation of low-k organic dielectric and its effective solution for damascene trenches
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Yeh, CF; Lee, YC; Su, YC; Wu, KH; Lin, CH |
| 國立交通大學 |
2014-12-08T15:26:42Z |
Smart dielectrics of fluorinated silicon glass prepared by liquid phase deposition method
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Yeh, CF; Chen, TF; Lee, YC; Liu, CH; Lin, SS |
| 國立交通大學 |
2014-12-08T15:26:34Z |
Impact of airborne molecular contamination to nano-device performance
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Yeh, CF; Hsiao, CW; Lin, SJ; Xie, ZM; Kusumi, T; Aomi, H; Kaneko, H; Da, BT; Tsai, MS |
顯示項目 56-65 / 119 (共12頁)
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