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"yeh cf"的相關文件
顯示項目 41-90 / 119 (共3頁)
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| 國立交通大學 |
2014-12-08T15:40:40Z |
Investigation of grain boundary control in the drain junction on laser-crystalized poly-Si thin film transistors
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Chen, TF; Yeh, CF; Lou, JC |
| 國立交通大學 |
2014-12-08T15:40:19Z |
Device transfer technology by backside etching (DTBE) for poly-Si thin-film transistors on glass/plastic substrate
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Wang, SC; Yeh, CF; Huang, CK; Dai, YT |
| 國立交通大學 |
2014-12-08T15:39:17Z |
The removal of airborne molecular contamination in cleanroom using PTFE and chemical filters
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Yeh, CF; Hsiao, CW; Lin, SJ; Hsieh, CM; Kusumi, T; Aomi, H; Kaneko, H; Dai, BT; Tsai, MS |
| 國立交通大學 |
2014-12-08T15:39:11Z |
Impact of air filter material on metal oxide semiconductor (MOS) device characteristics in HF vapor environment
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Hsiao, CW; Lou, JC; Yeh, CF; Hsieh, CM; Lin, SJ; Kusumi, T |
| 國立交通大學 |
2014-12-08T15:39:10Z |
Effects of grain boundaries on performance and hot-carrier reliability of excimer-laser annealed polycrystalline silicon thin film transistors
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Chen, TF; Yeh, CF; Lou, JC |
| 國立交通大學 |
2014-12-08T15:39:08Z |
A novel four-mask-processed poly-Si TFT fabricated using excimer laser crystallization of an edge-thickened alpha-Si active island
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Chen, TF; Yeh, CF; Liu, CY; Lou, JC |
| 國立交通大學 |
2014-12-08T15:37:19Z |
Post-Cu CMP cleaning for colloidal silica abrasive removal
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Chen, PL; Chen, JH; Tsai, MS; Dai, BT; Yeh, CF |
| 國立交通大學 |
2014-12-08T15:37:17Z |
Influence of measuring environment on the electrical characteristics of pentacene-based thin film transistors
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Wang, YW; Cheng, HL; Wang, YK; Hu, TH; Ho, JC; Lee, CC; Lei, TF; Yeh, CF |
| 國立交通大學 |
2014-12-08T15:37:09Z |
Fabricating thin-film transistors on plastic substrates using spin etching and device transfer
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Wang, SC; Yeh, CF; Hsu, CT; Lou, JC |
| 國立交通大學 |
2014-12-08T15:37:02Z |
Process improvement and reliability characteristics of spin-on poly-3-hexylthiophene thin-film transistor
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Wang, SC; Lou, JC; Liou, BL; Lin, RX; Yeh, CF |
| 國立交通大學 |
2014-12-08T15:27:43Z |
Novel low-stress SiO2-F-x(x) film deposited by room-temperature liquid-phase deposition method
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Yeh, CF; Lin, SS |
| 國立交通大學 |
2014-12-08T15:27:41Z |
Low temperature processed poly-Si thin-film transistors with thinner LPD-SiO2 as gate insulator and its reliability
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Fan, CL; Yeh, CF; Tsai, HK; Lur, W; Yen, PW |
| 國立交通大學 |
2014-12-08T15:27:40Z |
Approach to room temperature process - A novel thin liquid-phase deposited oxide
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Yeh, CF; Lin, SS |
| 國立交通大學 |
2014-12-08T15:27:39Z |
Investigation of high-power device and process for field emission display
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Yeh, CF; Liu, JS; Huang, CM |
| 國立交通大學 |
2014-12-08T15:27:34Z |
Selective SiO2-xFx growth with liquid-phase deposition for MEMS technology
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Yeh, CF; Lee, YC; Su, JL |
| 國立交通大學 |
2014-12-08T15:27:33Z |
A physically-based built-in Spice Poly-Si TFT model for circuit simulation and reliability evaluation
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Chung, SS; Chen, DC; Cheng, CT; Yeh, CF |
| 國立交通大學 |
2014-12-08T15:27:30Z |
Passivation effects of ion plating capping oxide on poly-Si TFTs
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Yeh, CF; Chen, TJ; Kao, JS |
| 國立交通大學 |
2014-12-08T15:27:24Z |
In-situ O-2-plasma passivation effect on poly-Si TFTs during ion plating capping oxide
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Yeh, CF; Chen, TJ; Lin, MT; Kao, JS |
| 國立交通大學 |
2014-12-08T15:27:24Z |
Effect of processing temperature on polysilicon thin-film transistors with liquid-phase deposited oxide as gate insulator
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Yeh, CF; Chen, TJ; Jeng, JN |
| 國立交通大學 |
2014-12-08T15:27:15Z |
Applying selective liquid-phase deposition to create contact holes in plasma damage-free process
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Yeh, CF; Liu, CH |
| 國立交通大學 |
2014-12-08T15:27:14Z |
Newly developed low-K and low-stress fluorinated silicon oxide utilizing temperature-difference liquid-phase deposition technology
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Yeh, CF; Lee, YC; Lee, SC |
| 國立交通大學 |
2014-12-08T15:27:13Z |
Highly reliable liquid-phase deposited SiO2 with nitrous oxide plasma post-treatment for low temperature processed poly-Si TFT's
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Yeh, CF; Chen, DC; Lu, CY; Liu, C; Lee, ST; Liu, CH; Chen, TJ |
| 國立交通大學 |
2014-12-08T15:27:06Z |
O-2-plasma degradation of low-k organic dielectric and its effective solution for damascene trenches
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Yeh, CF; Lee, YC; Su, YC; Wu, KH; Lin, CH |
| 國立交通大學 |
2014-12-08T15:26:42Z |
Smart dielectrics of fluorinated silicon glass prepared by liquid phase deposition method
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Yeh, CF; Chen, TF; Lee, YC; Liu, CH; Lin, SS |
| 國立交通大學 |
2014-12-08T15:26:34Z |
Impact of airborne molecular contamination to nano-device performance
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Yeh, CF; Hsiao, CW; Lin, SJ; Xie, ZM; Kusumi, T; Aomi, H; Kaneko, H; Da, BT; Tsai, MS |
| 國立交通大學 |
2014-12-08T15:25:48Z |
Fabrication of thin-film transistors on plastic substrates by spin etching and device transfer process
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Wang, SC; Hsu, CT; Yeh, CF; Lou, JC |
| 國立交通大學 |
2014-12-08T15:25:27Z |
A new observation of the germanium outdiffusion effect on the hot carrier and NBTI reliabilities in sub-100nm technology strained-Si/SiGe CMOS devices
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Chung, SS; Liu, YR; Yeh, CF; Wu, SR; Lai, CS; Chang, TY; Ho, JH; Liu, CY; Huang, CT; Tsai, CT; Shiau, WT; Sun, SW |
| 國立交通大學 |
2014-12-08T15:18:03Z |
Pentacene-based thin film transistors used to drive a twist-nematic liquid crystal display
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Wang, YW; Cheng, HL; Wang, YK; Hu, TH; Ho, JC; Lee, CC; Lei, TF; Yeh, CF |
| 國立交通大學 |
2014-12-08T15:05:01Z |
INVESTIGATION OF THERMAL COEFFICIENT FOR POLYCRYSTALLINE SILICON THERMAL SENSOR DIODE
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YEH, CF; LIN, SS; YANG, GP |
| 國立交通大學 |
2014-12-08T15:04:55Z |
THE NOVEL PREPARATION OF P-N-JUNCTION MESA DIODES BY SILICON-WAFER DIRECT BONDING (SDB)
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YEH, CF; SHYANG, HL |
| 國立交通大學 |
2014-12-08T15:04:47Z |
THE EFFECT OF TEMPERATURE ON I-V-CHARACTERISTICS OF A-SI-H PHOTODIODE
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CHANG, KL; YEH, CF |
| 國立交通大學 |
2014-12-08T15:04:31Z |
THE CHARACTERIZATION OF AL2O3 PREPARED BY ANODIC-OXIDATION
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YEH, CF; CHENG, JY; LU, JH |
| 國立交通大學 |
2014-12-08T15:04:25Z |
NOVEL TECHNIQUE FOR SIO2 FORMED BY LIQUID-PHASE DEPOSITION FOR LOW-TEMPERATURE PROCESSED POLYSILICON TFT
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YEH, CF; LIN, SS; CHEN, CL; YANG, YC |
| 國立交通大學 |
2014-12-08T15:04:20Z |
EXPERIMENTAL COMPARISON OF OFF-STATE CURRENT BETWEEN HIGH-TEMPERATURE-PROCESSED AND LOW-TEMPERATURE-PROCESSED UNDOPED CHANNEL POLYSILICON THIN-FILM TRANSISTORS
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YEH, CF; YANG, TZ; CHEN, CL; CHEN, TJ; YANG, YC |
| 國立交通大學 |
2014-12-08T15:04:20Z |
INVESTIGATION OF SI-SIO2 INTERFACE PROPERTIES FOR BONDED SILICON-ON-INSULATOR
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YEH, CF; KAO, HW; CHANG, BS; CHANG, KL |
| 國立交通大學 |
2014-12-08T15:04:13Z |
IMPROVED IV-CHARACTERISTICS OF POLYSILICON THIN-FILM TRANSISTORS WITH NOVEL DUAL-BUFFER DRAIN STRUCTURE
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YEH, CF; CHERN, CH |
| 國立交通大學 |
2014-12-08T15:04:07Z |
PERFORMANCE AND OFF-STATE CURRENT MECHANISMS OF LOW-TEMPERATURE PROCESSED POLYSILICON THIN-FILM TRANSISTORS WITH LIQUID-PHASE DEPOSITED SIO2 GATE INSULATOR
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YEH, CF; LIN, SS; YANG, TZ; CHEN, CL; YANG, YC |
| 國立交通大學 |
2014-12-08T15:04:04Z |
LOW-TEMPERATURE-PROCESSED POLY-SI THIN-FILM TRANSISTORS USING SOLID-PHASE-CRYSTALLIZED AND LIQUID-PHASE-DEPOSITED GATE OXIDE
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YEH, CF; CHEN, CL; YANG, YC; LIN, SS; YANG, TZ; HONG, TY |
| 國立交通大學 |
2014-12-08T15:03:56Z |
ROOM-TEMPERATURE SELECTIVE GROWTH OF DIELECTRIC FILMS BY LIQUID-PHASE DEPOSITION
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YEH, CF; CHEN, CL |
| 國立交通大學 |
2014-12-08T15:03:43Z |
THE PHYSICOCHEMICAL PROPERTIES AND GROWTH-MECHANISM OF OXIDE (SIO2-XFX) BY LIQUID-PHASE DEPOSITION WITH H2O ADDITION ONLY
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YEH, CF; CHEN, CL; LIN, GH |
| 國立交通大學 |
2014-12-08T15:03:33Z |
CHARACTERISTICS OF SELF-INDUCED LIGHTLY-DOPED-DRAIN POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS WITH LIQUID-PHASE DEPOSITION SIO2 AS GATE-INSULATOR AND PASSIVATION-LAYER
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YEH, CF; YANG, TZ; CHEN, TJ |
| 國立交通大學 |
2014-12-08T15:03:31Z |
BOND-STRUCTURE CHANGES OF LIQUID-PHASE DEPOSITED OXIDE (SIO2-XFX) ON N2 ANNEALING
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YEH, CF; CHEN, CL; LUR, W; YEN, PW |
| 國立交通大學 |
2014-12-08T15:03:22Z |
FABRICATION OF MOSFETS USING LOW-TEMPERATURE LIQUID-PHASE DEPOSITED OXIDE
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YEH, CF; LIN, SS; HONG, TY |
| 國立交通大學 |
2014-12-08T15:03:17Z |
LOW-TEMPERATURE PROCESSED MOSFETS WITH LIQUID-PHASE DEPOSITED SIO2-XFX AS GATE INSULATOR
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YEH, CF; LIN, SS; HONG, TY |
| 國立交通大學 |
2014-12-08T15:03:16Z |
EFFECTS OF PLASMA TREATMENT ON THE PROPERTIES OF ROOM-TEMPERATURE LIQUID-PHASE DEPOSITED (LPD) OXIDE-FILMS
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YEH, CF; LIN, SS |
| 國立交通大學 |
2014-12-08T15:03:11Z |
CHARACTERIZATION OF THE CHEMICAL-MECHANICAL POLISHING PROCESS-BASED ON NANOINDENTATION MEASUREMENT OF DIELECTRIC FILMS
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LIU, CW; DAI, BT; YEH, CF |
| 國立交通大學 |
2014-12-08T15:03:10Z |
CONTROLLING FLUORINE CONCENTRATION AND THERMAL ANNEALING EFFECT ON LIQUID-PHASE DEPOSITED SIO2-XFX FILMS
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YEH, CF; CHEN, CL |
| 國立交通大學 |
2014-12-08T15:03:07Z |
THINNER LIQUID-PHASE DEPOSITED OXIDE FOR POLYSILICON THIN-FILM TRANSISTORS
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YEH, CF; LIN, SS; FAN, CL |
| 國立交通大學 |
2014-12-08T15:03:02Z |
Chemical mechanical polishing of PSG and BPSG dielectric films: The effect of phosphorus and boron concentration
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Liu, CW; Dai, BT; Yeh, CF |
| 國立交通大學 |
2014-12-08T15:02:52Z |
Modeling of the wear mechanism during chemical-mechanical polishing
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Liu, CW; Dai, BT; Tseng, WT; Yeh, CF |
顯示項目 41-90 / 119 (共3頁)
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