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Showing items 71-80 of 119  (12 Page(s) Totally)
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Institution Date Title Author
國立交通大學 2014-12-08T15:04:47Z THE EFFECT OF TEMPERATURE ON I-V-CHARACTERISTICS OF A-SI-H PHOTODIODE CHANG, KL; YEH, CF
國立交通大學 2014-12-08T15:04:31Z THE CHARACTERIZATION OF AL2O3 PREPARED BY ANODIC-OXIDATION YEH, CF; CHENG, JY; LU, JH
國立交通大學 2014-12-08T15:04:25Z NOVEL TECHNIQUE FOR SIO2 FORMED BY LIQUID-PHASE DEPOSITION FOR LOW-TEMPERATURE PROCESSED POLYSILICON TFT YEH, CF; LIN, SS; CHEN, CL; YANG, YC
國立交通大學 2014-12-08T15:04:20Z EXPERIMENTAL COMPARISON OF OFF-STATE CURRENT BETWEEN HIGH-TEMPERATURE-PROCESSED AND LOW-TEMPERATURE-PROCESSED UNDOPED CHANNEL POLYSILICON THIN-FILM TRANSISTORS YEH, CF; YANG, TZ; CHEN, CL; CHEN, TJ; YANG, YC
國立交通大學 2014-12-08T15:04:20Z INVESTIGATION OF SI-SIO2 INTERFACE PROPERTIES FOR BONDED SILICON-ON-INSULATOR YEH, CF; KAO, HW; CHANG, BS; CHANG, KL
國立交通大學 2014-12-08T15:04:13Z IMPROVED IV-CHARACTERISTICS OF POLYSILICON THIN-FILM TRANSISTORS WITH NOVEL DUAL-BUFFER DRAIN STRUCTURE YEH, CF; CHERN, CH
國立交通大學 2014-12-08T15:04:07Z PERFORMANCE AND OFF-STATE CURRENT MECHANISMS OF LOW-TEMPERATURE PROCESSED POLYSILICON THIN-FILM TRANSISTORS WITH LIQUID-PHASE DEPOSITED SIO2 GATE INSULATOR YEH, CF; LIN, SS; YANG, TZ; CHEN, CL; YANG, YC
國立交通大學 2014-12-08T15:04:04Z LOW-TEMPERATURE-PROCESSED POLY-SI THIN-FILM TRANSISTORS USING SOLID-PHASE-CRYSTALLIZED AND LIQUID-PHASE-DEPOSITED GATE OXIDE YEH, CF; CHEN, CL; YANG, YC; LIN, SS; YANG, TZ; HONG, TY
國立交通大學 2014-12-08T15:03:56Z ROOM-TEMPERATURE SELECTIVE GROWTH OF DIELECTRIC FILMS BY LIQUID-PHASE DEPOSITION YEH, CF; CHEN, CL
國立交通大學 2014-12-08T15:03:43Z THE PHYSICOCHEMICAL PROPERTIES AND GROWTH-MECHANISM OF OXIDE (SIO2-XFX) BY LIQUID-PHASE DEPOSITION WITH H2O ADDITION ONLY YEH, CF; CHEN, CL; LIN, GH

Showing items 71-80 of 119  (12 Page(s) Totally)
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