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"yeh chune sin"
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| 國立交通大學 |
2014-12-08T15:12:44Z |
Miniature RF test structure for on-wafer device testing and in-line process monitoring
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Cho, Ming-Hsiang; Lee, Ryan; Peng, An-Sam; Chen, David; Yeh, Chune-Sin; Wu, Lin-Kun |
| 國立成功大學 |
2009-04 |
Hot-Carrier and Fowler-Nordheim (FN) Tunneling Stresses on RF Reliability of 40-nm PMOSFETs With and Without SiGe Source/Drain
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Tang, Mao-Chyuan; Fang, Yean-Kuen; Chen, David C.; Yeh, Chune-Sin |
| 國立成功大學 |
2008-11-21 |
Effect of hot carrier stress on RF reliability of 40 nm PMOSFETs with and without SiGe source/drain
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Tang, Mao-Chyuan; Fang, Yean-Kuen; Wei, Sun-Chin; Chen, David C.; Yeh, Chune-Sin; Huang-Lu, Shiang |
| 國立成功大學 |
2008-06 |
Investigation and modeling of hot carrier effects on performance of 45-and 55-nm NMOSFETs with RF automatic measurement
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Tang, Mao-Chyuan; Fang, Yean-Kuen; Liao, Wen-Shiang; Chen, David C.; Yeh, Chune-Sin; Chien, Shan-Chieh |
| 國立臺灣大學 |
2008 |
Shallow-Trench-Isolation (STI)-Induced Mechanical-Stress-Related Kink-Effect Behaviors of 40-nm PD SOI NMOS Device
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Su, V. C.; Kuo, James B.; Lin, I. S.; Lin, Guan-Shyan; Chen, David C.; Yeh, Chune-Sin; Tsai, Cheng-Tzung; Ma, Mike |
Showing items 1-5 of 5 (1 Page(s) Totally)
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