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Showing items 1-2 of 2 (1 Page(s) Totally) 1 View [10|25|50] records per page
| 國立交通大學 |
2014-12-08T15:17:41Z |
Relieving the current crowding effect in flip-chip solder joints during current stressing
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Liang, SW; Shao, TL; Chen, C; Yeh, ECC; Tu, KN |
| 國立交通大學 |
2014-12-08T15:16:40Z |
Temperature and current-density distributions in flip-chip solder joints with Cu traces
|
Hsu, CY; Yao, DJ; Liang, SW; Chen, C; Yeh, ECC |
Showing items 1-2 of 2 (1 Page(s) Totally) 1 View [10|25|50] records per page
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