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"yeh f s"
Showing items 1-10 of 44 (5 Page(s) Totally)
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| 臺大學術典藏 |
2020-01-17T03:09:31Z |
Expression of a bi-functional and thermostable amylopullulanase in transgenic rice seeds leads to autohydrolysis and altered composition of starch
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Chiang C.-M.; Yeh F.-S.; Huang L.-F.; Tseng T.-H.; Chung M.-C.; Wang C.-S.; Lur H.-S.; Shaw J.-F.; Yu S.-M.; HUU-SHENG LUR; HUU-SHENG LUR;Yu S.-M.;Shaw J.-F.;Lur H.-S.;Wang C.-S.;Chung M.-C.;Tseng T.-H.;Huang L.-F.;Yeh F.-S.;Chiang C.-M. |
| 國立交通大學 |
2019-04-02T06:00:59Z |
Low-V-t TaN/HfLaO n-MOSFETs Using Low-Temperature Formed Source-Drain Junctions
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Lin, S. H.; Liu, S. L.; Yeh, F. S.; Chin, Albert |
| 國立交通大學 |
2019-04-02T06:00:30Z |
A Study on Frequency-Dependent Voltage Nonlinearity of SrTiO3 rf Capacitor
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Cheng, C. H.; Huang, C. C.; Hsu, H. H.; Chen, P. C.; Chiang, K. C.; Chin, Albert; Yeh, F. S. |
| 國立交通大學 |
2019-04-02T06:00:13Z |
High-Density and Low-Leakage-Current MIM Capacitor Using Stacked TiO2/ZrO2 Insulators
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Lin, S. H.; Chiang, K. C.; Chin, Albert; Yeh, F. S. |
| 國立交通大學 |
2019-04-02T06:00:13Z |
Flat band voltage control on low V-t metal-gate/high-kappa CMOSFETs with small EOT
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Chin, Albert; Chang, M. F.; Lin, S. H.; Chen, W. B.; Lee, P. T.; Yeh, F. S.; Liao, C. C.; Li, M. -F.; Su, N. C.; Wang, S. J. |
| 國立交通大學 |
2019-04-02T05:59:55Z |
Stacked GeO/SrTiOx Resistive Memory with Ultralow Resistance Currents
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Cheng, C. H.; Chin, Albert; Yeh, F. S. |
| 國立交通大學 |
2019-04-02T05:59:52Z |
Ultralow Switching Energy Ni/GeOx/HfON/TaN RRAM
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Cheng, C. H.; Chin, Albert; Yeh, F. S. |
| 國立交通大學 |
2019-04-02T05:58:47Z |
Improved Stress Reliability of Analog Metal-Insulator-Metal Capacitors Using TiO2/ZrO2 Dielectrics
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Lin, S. H.; Chiang, K. C.; Yeh, F. S.; Chin, Albert |
| 國立交通大學 |
2019-04-02T05:58:25Z |
Higher-kappa titanium dioxide incorporating LaAlO3 as dielectrics for MIM capacitors
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Cheng, C. H.; Hsu, H. H.; Chen, P. C.; Liou, B. H.; Chin, Albert; Yeh, F. S. |
| 國立交通大學 |
2019-04-02T05:57:57Z |
Long-Endurance Nanocrystal TiO2 Resistive Memory Using a TaON Buffer Layer
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Cheng, C. H.; Chen, P. C.; Wu, Y. H.; Yeh, F. S.; Chin, Albert |
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