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Institution Date Title Author
國立成功大學 2024-07-16 利用射頻濺鍍法沉積氧化鉿摻雜釔薄膜對電阻式記憶體特性的影響及緩衝層在神經突觸應用中的脈衝響應與分析 葉冠麟; Yeh, Kuan-Lin
國立高雄應用科技大學 2017 不同封膠、電漿功率與濺鍍薄膜厚度對封裝層的表面特性影響 葉冠麟; YEH, KUAN-LIN
中山醫學大學 2017 排隊美食行為因素之研究-以台中大專校院學生為例 葉冠麟; Yeh, Kuan-Lin
國立交通大學 2014-12-08T15:25:06Z Process induced instability and reliability issues in low temperature poly-Si thin film transistors Chen, Chih-Yang; Wang, Shen-De; Shieh, Ming-Shan; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Lee, Jam-Wen; Lei, Tan-Fu
國立交通大學 2014-12-08T15:15:31Z Plasma damage-enhanced negative bias temperature instability in low-temperature polycrystalline silicon thin-film transistors Chen, Chih-Yang; Lee, Jam-Wem; Chen, Wei-g Chen; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Lee, Po-Hao; Wang, Shen-De; Lei, Tan-Fu
國立交通大學 2014-12-08T15:15:10Z Plasma-induced damage on the performance and reliability of low-temperature polycrystalline silicon thin-film transistors Chen, Chih-Yang; Wang, Shen-De; Shieh, Ming-Shan; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Lee, Jam-Wem; Lei, Tan-Fu
國立交通大學 2014-12-08T15:15:06Z Bias temperature instabilities for low-temperature polycrystalline silicon complementary thin-film transistors Chen, Chih-Yang; Lee, Jam-Wem; Ma, Ming-Wen; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Wang, Shen-De; Lei, Tan-Fu
國立交通大學 2014-12-08T15:14:11Z A reliability model for low-temperature polycrystalline silicon thin-film transistors Chen, Chih-Yang; Lee, Jam-Wem; Lee, Po-Hao; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Ma, Ming-Wen; Wang, Shen-De; Lei, Tan-Fu
國立交通大學 2014-12-08T15:12:39Z Analysis of negative bias temperature instability in body-tied low-temperature polycrystalline silicon thin-film transistors Chen, Chih-Yang; Ma, Ming-Wen; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Wang, Shen-De; Lei, Tan-Fu
國立交通大學 2014-12-08T15:11:26Z Dynamic negative bias temperature instability in low-temperature poly-Si thin-film transistors Chen, Chih-Yang; Wang, Tong-Yi; Ma, Ming-Wen; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Wang, Shen-De; Lei, Tan-Fu

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