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Institution	Date	Title	Author
國立交通大學	2017-04-21T06:49:16Z	The Impact of Layout Dependent Stress and Gate Resistance on High Frequency Performance and Noise in Multifinger and Donut MOSFETs	Ku, Chih-You; Yeh, Kuo-Ling; Guo, Jyh-Chyurn

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