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"yeh ta ching"的相關文件
顯示項目 1-8 / 8 (共1頁)
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| 國立交通大學 |
2014-12-08T15:48:22Z |
Asymmetric Gate Capacitance and High Frequency Characteristic Fluctuations in 16 nm Bulk MOSFETs Due to Random Distribution of Discrete Dopants
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Li, Yiming; Hwang, Chih-Hong; Yeh, Ta-Ching |
| 國立交通大學 |
2014-12-08T15:28:22Z |
Three-dimensional simulation of field emission triode structure using carbon-nanotube emitters
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Li, Yiming; Yeh, Ta-Ching |
| 國立交通大學 |
2014-12-08T15:15:13Z |
Discrete Dopant Induced Characteristic Fluctuations in 16nm Multiple-Gate SOI Devices
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Li, Yiming; Hwang, Chih-Hong; Huang, Hsuan-Ming; Yeh, Ta-Ching |
| 國立交通大學 |
2014-12-08T15:08:33Z |
Characteristic fluctuation dependence on discrete dopant for 16nm SOI FinFETs at different temperature
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Li, Yiming; Hwang, Chih-Hong; Yu, Shao-Ming; Huang, Hsuan-Ming; Yeh, Ta-Ching; Cheng, Hui-Wen; Chen, Hung-Ming; Hwang, Jiunn-Ren; Yang, Fu-Liang |
| 國立交通大學 |
2014-12-08T15:02:42Z |
Reduction of Discrete-Dopant-Induced High-Frequency Characteristic Fluctuations in Nanoscale CMOS Circuit
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Li, Yiming; Hwang, Chih-Hong; Yeh, Ta-Ching; Huang, Hsuan-Ming; Li, Tien-Yeh; Cheng, Hui-Wen |
| 國立交通大學 |
2014-12-08T15:02:41Z |
Emission Efficiency Dependence on the Tilted Angle of Nanogaps in Surface Conduction Electron-Emitter
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Li, Yiming; Kuo, Yi-Ting; Cheng, Hui-Wen; Yeh, Ta-Ching; Lo, Hsiang-Yu; Chiang, Mei-Tsao; Mo, Chi-Neng |
| 國立交通大學 |
2014-12-08T15:02:21Z |
Comprehensive Examination of Threshold Voltage Fluctuations in Nanoscale Planar MOSFET and Bulk FinFET Devices
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Hwang, Chih-Hong; Cheng, Hui-Wen; Yeh, Ta-Ching; Li, Tien-Yeh; Huang, Hsuan-Ming; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:01:05Z |
Morphology effect on field emission property of carbon nanotube emitters in triode structure
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Cheng, Hui-Wen; Yeh, Ta-Ching; Kuo, Yi-Ting; Li, Yiming; Lin, Chen-Chun; Pan, Fu-Ming; Chiang, Mei-Tsao; Lo, Kuo-Chung; Mo, Chi-Neng |
顯示項目 1-8 / 8 (共1頁)
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