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"yeh wen kuan"的相关文件
显示项目 71-79 / 79 (共4页)
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| 國立成功大學 |
2004-06 |
The effect of thermal treatment on device characteristic and reliability for sub-100-nm CMOSFETs
|
Yeh, Wen-Kuan; Fang, Yean-Kuen; Chen, Mao-Chieh |
| 國立成功大學 |
2004-05 |
Substrate noise-coupling characterization and efficient suppression in CMOS technology
|
Yeh, Wen-Kuan; Chen, Shuo-Mao; Fang, Yean-Kuen |
| 國立成功大學 |
2004-03 |
Characterization and modeling of SOI varactors at various temperatures
|
Chen, Kun-Ming; Huang, Guo-Wei; Wang, Sheng-Chun; Yeh, Wen-Kuan; Fang, Yean-Kuen; Yang, Fu-Liang |
| 國立成功大學 |
2004-03 |
Design and fabrication of deep submicron CMOS technology compatible suspended high-Q spiral inductors
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Hsieh, Ming-Chun; Fang, Yean-Kuen; Chen, Chin-Hsing; Chen, Shuo-Mao; Yeh, Wen-Kuan |
| 國立成功大學 |
2003-04 |
Hot-carrier-induced degradation on 0.1 mu m partially depleted silicon-on-insulator complementary metal-oxide-semiconductor field-effect-transistor
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Yeh, Wen-Kuan; Wang, Wen-Han; Fang, Yean-Kuen; Yang, Fu-Liang |
| 國立成功大學 |
2002-12 |
Hot-carrier-induced degradation for partially depleted SOI 0.25-0.1 mu m CMOSFET with 2-nm thin gate oxide
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Yeh, Wen-Kuan; Wang, Wen-Han; Fang, Yean-Kuen; Chen, Mao-Chieh; Yang, Fu-Liang |
| 國立成功大學 |
2002-07 |
Temperature dependence of hot-carrier-induced degradation in 0.1 mu m SOI nMOSFETs with thin oxide
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Yeh, Wen-Kuan; Wang, Wen-Han; Fang, Yean-Kuen; Yang, Fu-Liang |
| 國立成功大學 |
2002-05-01 |
New observations on hot-carrier degradation in 0.1 mu m silicon-on-insulator n-type metal oxide semiconductor field effect transistors
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Yeh, Wen-Kuan; Wang, Wen-Han; Fang, Yean-Kuen; Yang, Fu-Liang |
| 國立臺灣大學 |
1996 |
Photoluminescence from ordered and disordered Si-SiGe superlattices
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Chang, Ting-Chang; Yeh, Wen-Kuan; Mei, Yu-Jane; Tsai, Wen-Chung; Chang, Chun-Yen; Chen, Y. F. |
显示项目 71-79 / 79 (共4页)
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