|
|
???tair.name??? >
???browser.page.title.author???
|
"yeh wen kuan"???jsp.browse.items-by-author.description???
Showing items 11-35 of 79 (4 Page(s) Totally) 1 2 3 4 > >> View [10|25|50] records per page
| 國立交通大學 |
2018-08-21T05:56:39Z |
A Numerical Study of Si-TMD Contact with n/p Type Operation and Interface Barrier Reduction for Sub-5 nm Monolayer MoS2 FET
|
Tang, Ying-Tsan; Li, Kai-Shin; Li, Lain-Jong; Li, Ming-Yang; Lin, Chang-Hsien; Chen, Yi-Ju; Chen, Chun-Chi; Su, Chuan-Jung; Wu, Bo-Wei; Wu, Cheng-San; Chen, Min-Cheng; Shieh, Jia-Min; Yeh, Wen-Kuan; Su, Po-Cheng; Wang, Tahui; Yang, Fu-Liang; Hu, Chenming |
| 國立交通大學 |
2018-08-21T05:56:39Z |
First Fully Functionalized Monolithic 3D(+) IoT Chip with 0.5 V Light-electricity Power Management, 6.8 GHz Wireless-communication VCO, and 4-layer Vertical ReRAM
|
Hsueh, Fu-Kuo; Shen, Chang-Hong; Shieh, Jia-Min; Li, Kai-Shin; Chen, Hsiu-Chih; Huang, Wen-Hsien; Wang, Hsing-Hsiang; Yang, Chih-Chao; Hsieh, Tung-Ying; Lin, Chang-Hsien; Chen, Bo-Yuan; Shiao, Yu-Shao; Huang, Guo-Wei; Wong, Oi-Ying; Chen, Po-Hung; Yeh, Wen-Kuan |
| 國立交通大學 |
2018-08-21T05:53:58Z |
Experimental Realization of Thermal Stability Enhancement of Nickel Germanide Alloy by Using TiN Metal Capping
|
Chou, Chen-Han; Tsai, Yi-He; Hsu, Chung-Chun; Jau, Yu-Hau; Lin, Yu-Hsien; Yeh, Wen-Kuan; Chien, Chao-Hsin |
| 國立交通大學 |
2018-08-21T05:53:19Z |
Incorporating Yttrium into a GeO Interfacial Layer with HfO2-Based Gate Stack on Ge
|
Chou, Chen-Han; Lu, Yu-Hong; Tsai, Yi-He; Shih, An-Shih; Yeh, Wen-Kuan; Chien, Chao-Hsin |
| 國立交通大學 |
2017-04-21T06:56:37Z |
Enabling n-type polycrystalline Ge junctionless FinFET of low thermal budget by in situ doping of channel and visible pulsed laser annealing
|
Huang, Wen-Hsien; Shieh, Jia-Min; Kao, Ming-Hsuan; Shen, Chang-Hong; Huang, Tzu-En; Wang, Hsing-Hsiang; Yang, Chih-Chao; Hsieh, Tung-Ying; Hsieh, Jin-Long; Yu, Peichen; Yeh, Wen-Kuan |
| 國立交通大學 |
2017-04-21T06:56:33Z |
Junction-less poly-Ge FinFET and charge-trap NVM fabricated by laser-enabled low thermal budget processes
|
Huang, Wen-Hsien; Shieh, Jia-Min; Shen, Chang-Hong; Huang, Tzu-En; Wang, Hsing-Hsiang; Yang, Chih-Chao; Hsieh, Tung-Ying; Hsieh, Jin-Long; Yeh, Wen-Kuan |
| 國立交通大學 |
2017-04-21T06:55:58Z |
Improving Thermal Stability and Interface State Density of High-kappa Stacks by Incorporating Hf into an Interfacial Layer on p-Germanium
|
Tsai, Yi-He; Chou, Chen-Han; Shih, An-Shih; Jau, Yu-Hau; Yeh, Wen-Kuan; Lin, Yu-Hsien; Ko, Fu-Hsiang; Chien, Chao-Hsin |
| 國立交通大學 |
2017-04-21T06:55:42Z |
Low-Leakage Tetragonal ZrO2 (EOT < 1 nm) With In Situ Plasma Interfacial Passivation on Germanium
|
Chou, Chen-Han; Chang, Hao-Hsuan; Hsu, Chung-Chun; Yeh, Wen-Kuan; Chien, Chao-Hsin |
| 國立交通大學 |
2017-04-21T06:50:15Z |
MOS2 U-shape MOSFET with 10 nm Channel Length and Poly-Si Source/Drain Serving as Seed for Full Wafer CVD MOS2 Availability
|
Li, Kai-Shin; Wu, Bo-Wei; Li, Lain-Jong; Li, Ming-Yang; Cheng, Chia-Chin Kevin; Hsu, Cho-Lun; Lin, Chang-Hsien; Chen, Yi-Ju; Chen, Chun-Chi; Wu, Chien-Ting; Chen, Min-Cheng; Shieh, Jia-Min; Yeh, Wen-Kuan; Chueh, Yu-Lun; Yang, Fu-Liang; Hu, Chenming |
| 國立交通大學 |
2017-04-21T06:49:14Z |
Hybrid Si/TMD 2D Electronic Double Channels Fabricated Using Solid CVD Few-Layer-MoS2 Stacking for V-th Matching and CMOS-Compatible 3DFETs
|
Chen, Min-Cheng; Lin, Chia-Yi; Li, Kai-Hsin; Li, Lain-Jong; Chen, Chang-Hsiao; Chuang, Cheng-Hao; Lee, Ming-Dao; Chen, Yi-Ju; Hou, Yun-Fang; Lin, Chang-Hsien; Chen, Chun-Chi; Wu, Bo-Wei; Wu, Cheng-San; Yang, Ivy; Lee, Yao-Jen; Yeh, Wen-Kuan; Wang, Tahui; Yang, Fu-Liang; Hu, Chenming |
| 國立交通大學 |
2017-04-21T06:49:12Z |
Logic/Memory Hybrid 3D Sequentially Integrated Circuit Using Low Thermal Budget Laser Process
|
Yang, Chih-Chao; Hsieh, Tung-Ying; Huang, Wen-Hsien; Wu, Tsung-Ta; Wang, Hsing-Hsiang; Shen, Chang-Hong; Kao, Ming-Hsuan; Yeh, Wen-Kuan; Chang, Meng-Fan; Wu, Meng-Chyi; Shieh, Jia-Min |
| 國立交通大學 |
2017-04-21T06:49:09Z |
a-SiGeC Thin Film Photovoltaic Enabled Self-Power Monolithic 3D IC Under Indoor Illumination
|
Kao, Ming-Hsuan; Yang, Chih-Chao; Wu, Tsung-Ta; Hsieh, Tung-Ying; Huang, Wen-Hsieh; Wang, Hsing-Hsiang; Shen, Chang-Hong; Yeh, Wen-Kuan; Chang, Meng-Fan; Shieh, Jia-Min |
| 國立交通大學 |
2017-04-21T06:48:48Z |
3D-TCAD Simulation Study of the Contact All Around T-FinFET Structure for 10nm Metal-Oxide-Semiconductor Field-Effect Transistor
|
Chou, Chen-Han; Hsu, Chung-Chun; Yeh, Wen-Kuan; Chung, Steve S.; Chien, Chao-Hsin |
| 國立交通大學 |
2017-04-21T06:48:46Z |
Suspended Ge Gate-All-Around Nanowire nFETs with Junction Isolation on Bulk Si
|
Wan, Chia-Chen; Luo, Guang-Li; Hsu, Shu-Han; Hung, Kuo-Dong; Chu, Chun-Lin; Hou, Tuo-Hung; Su, Chun-Jun; Chen, Szu-Hung; Wu, Wen-Fa; Yeh, Wen-Kuan |
| 國立交通大學 |
2017-04-21T06:48:19Z |
Diamond-shaped Ge and Ge0.9Si0.1 Gate-All-Around Nanowire FETs with Four {111} Facets by Dry Etch Technology
|
Lee, Yao-Jen; Hou, Fu-Ju; Chuang, Shang-Shiun; Hsueh, Fu-Kuo; Kao, Kuo-Hsing; Sung, Po-Jung; Yuan, Wei-You; Yao, Jay-Yi; Lu, Yu-Chi; Lin, Kun-Lin; Wu, Chien-Ting; Chen, Hisu-Chih; Chen, Bo-Yuan; Huang, Guo-Wei; Chen, Henry J. H.; Li, Jiun-Yun; Li, Yiming; Samukawa, Seiji; Chao, Tien-Sheng; Tseng, Tseung-Yuen; Wu, Wen-Fa; Hou, Tuo-Hung; Yeh, Wen-Kuan |
| 國立交通大學 |
2017-04-21T06:48:19Z |
High Performance Poly Si Junctionless Transistors with Sub-5nm Conformally Doped Layers by Molecular Monolayer Doping and Microwave Incorporating CO2 Laser Annealing for 3D Stacked ICs Applications
|
Lee, Yao-Jen; Cho, Ta-Chun; Sung, Po-Jung; Kao, Kuo-Hsing; Hsueh, Fu-Kuo; Hou, Fu-Ju; Chen, Po-Cheng; Chen, Hsiu-Chih; Wu, Chien-Ting; Hsu, Shu-Han; Chen, Yi-Ju; Huang, Yao-Ming; Hou, Yun-Fang; Huang, Wen-Hsien; Yang, Chih-Chao; Chen, Bo-Yuan; Lin, Kun-Lin; Chen, Min-Cheng; Shen, Chang-Hong; Huang, Guo-Wei; Huang, Kun-Ping; Current, Michael I.; Li, Yiming; Samukawa, Seiji; Wu, Wen-Fa; Shieh, Jia-Min; Chao, Tien-Sheng; Yeh, Wen-Kuan |
| 國立交通大學 |
2017-04-21T06:48:18Z |
TMD FinFET with 4 nm Thin Body and Back Gate Control for Future Low Power Technology
|
Chen, Min-Cheng; Li, Kai-Shin; Li, Lain-Jong; Lu, Ang-Yu; Li, Ming-Yang; Chang, Yung-Huang; Lin, Chang-Hsien; Chen, Yi-Ju; Hou, Yun-Fang; Chen, Chun-Chi; Wu, Bo-Wei; Wu, Cheng-San; Yang, Ivy; Lee, Yao-Jen; Shieh, Jia-Min; Yeh, Wen-Kuan; Shih, Jyun-Hong; Su, Po-Cheng; Sachid, Angada B.; Wang, Tahui; Yang, Fu-Liang; Hu, Chenming |
| 國立成功大學 |
2016-12 |
Microstructure and piezoelectric properties of reactively sputtered highly C-axis ScxAl1-xN thin films on diamond-like carbon/Si substrate
|
Liauh, Woan Jwu; Wu, Sean; Huang, Jow-Lay; Lii, Ding-Fwu; Lin, Zhi-Xun; Yeh, Wen-Kuan |
| 國立成功大學 |
2016-04-29 |
Microstructure and Piezoelectric Properties of Reactively Sputtered Highly C-axis ScxAl1-xN Thin Films on Diamond-Like Carbon/Si Substrate
|
Liauh, Woan-Jwu; Wu, Sean; Huang, Jow-Lay; Lii, Ding-Fwu; Lin, Zhi-Xun; Yeh, Wen-Kuan |
| 國立交通大學 |
2014-12-08T15:23:37Z |
Experimental Verification of RF Stress Effect on Cascode Class-E PA Performance and Reliability
|
Yuan, Jiann-Shiun; Yen, Hsuan-Der; Chen, Shuyu; Wang, Ruey-Lue; Huang, Guo-Wei; Juang, Ying-Zong; Tu, Chih-Ho; Yeh, Wen-Kuan; Ma, Jun |
| 國立交通大學 |
2014-12-08T15:12:04Z |
Effect of NH(3) Plasma Nitridation on Hot-Carrier Instability and Low-Frequency Noise in Gd-Doped High-kappa Dielectric nMOSFETs
|
Chen, Yu-Ting; Chen, Kun-Ming; Lin, Cheng-Li; Yeh, Wen-Kuan; Huang, Guo-Wei; Lai, Chien-Ming; Chen, Yi-Wen; Hsu, Che-Hua; Huang, Fon-Shan |
| 國立高雄大學 |
2011-03 |
The Improvement of High-k/Metal Gate pMOSFET Performance and Reliability Using Optimized Si Cap/SiGe Channel Structure
|
Yeh, Wen-Kuan; Chen, Yu-Ting; Huang, Fon-Shan; Hsu, Chia-Wei; Chen, Chun-Yu; Fang, Yean-Kuen; Gan, Kwang-Jow; Chen, Po-Ying |
| 國立成功大學 |
2011-03 |
The Improvement of High-k/Metal Gate pMOSFET Performance and Reliability Using Optimized Si Cap/SiGe Channel Structure
|
Yeh, Wen-Kuan; Chen, Yu-Ting; Huang, Fon-Shan; Hsu, Chia-Wei; Chen, Chun-Yu; Fang, Yean-Kuen; Gan, Kwang-Jow; Chen, Po-Ying |
| 國立高雄大學 |
2011 |
NBTI reliability on high-k metal-gate SiGe transistor and circuit performances
|
Yuan, Jiann-Shiun; Yeh, Wen-Kuan; Chen, Shuyu; Hsu, Chia-Wei |
| 國立高雄大學 |
2011 |
Impact of SOI thickness on device performance and gate oxide reliability of Ni fully silicide metal-gate strained SOI MOSFET
|
Lin, Cheng-Li; Yeh, Wen-Kuan |
Showing items 11-35 of 79 (4 Page(s) Totally) 1 2 3 4 > >> View [10|25|50] records per page
|