| 國立交通大學 |
2014-12-08T15:22:57Z |
Transient-to-Digital Converter for Protection Design in CMOS Integrated Circuits against Electrical Fast Transient
|
Yen, Cheng-Cheng; Ker, Ming-Dou; Liao, Chi-Sheng; Chen, Tung-Yang; Tsai, Chih-Chung |
| 國立交通大學 |
2014-12-08T15:22:31Z |
On-chip detection circuit for protection design in display panel against electrical fast transient (EFT) disturbance
|
Yen, Cheng-Cheng; Ker, Ming-Dou; Lin, Wan-Yen; Yang, Che-Ming; Chen, Shih-Fan; Chen, Tung-Yang |
| 國立交通大學 |
2014-12-08T15:20:53Z |
New 4-Bit Transient-to-Digital Converter for System-Level ESD Protection in Display Panels
|
Ker, Ming-Dou; Yen, Cheng-Cheng |
| 國立交通大學 |
2014-12-08T15:15:15Z |
Latchup-like failure of power-rail ESD clamp circuits in CMOS integrated circuits under system-level ESD test
|
Ker, Ming-Dou; Yen, Cheng-Cheng |
| 國立交通大學 |
2014-12-08T15:15:12Z |
Failure of on-chip power-fall ESD clamp circuits during system-level ESD test
|
Yen, Cheng-Cheng; Ker, Ming-Dou |
| 國立交通大學 |
2014-12-08T15:12:38Z |
Transient-induced latchup in CMOS integrated circuits due to electrical fast transient (EFT) test
|
Yen, Cheng-Cheng; Ker, Ming-Dou |
| 國立交通大學 |
2014-12-08T15:12:37Z |
On-chip transient detection circuit for system-level ESD protection in CMOS integrated circuits to meet electromagnetic compatibility regulation
|
Ker, Ming-Dou; Yen, Cheng-Cheng; Shih, Pi-Chia |
| 國立交通大學 |
2014-12-08T15:11:44Z |
Unexpected failure in power-rail ESD clamp circuits of CMOS integrated circuits in microelectronics systems during electrical fast transient (EFT) test and the re-design solution
|
Ker, Ming-Dou; Yen, Cheng-Cheng |
| 國立交通大學 |
2014-12-08T15:09:25Z |
Transient-Induced Latchup in CMOS ICs Under Electrical Fast-Transient Test
|
Yen, Cheng-Cheng; Ker, Ming-Dou; Chen, Tung-Yang |
| 國立交通大學 |
2014-12-08T15:09:25Z |
The Effect of IEC-Like Fast Transients on RC-Triggered ESD Power Clamps
|
Yen, Cheng-Cheng; Ker, Ming-Dou |
| 國立交通大學 |
2014-12-08T15:09:04Z |
Transient-to-Digital Converter for System-Level Electrostatic Discharge Protection in CMOS ICs
|
Ker, Ming-Dou; Yen, Cheng-Cheng |
| 國立交通大學 |
2014-12-08T15:04:50Z |
New transient detection circuit for system-level ESD protection
|
Yen, Cheng-Cheng; Liao, Chi-Sheng; Ker, Ming-Dou |
| 國立交通大學 |
2014-12-08T15:04:24Z |
Transient Detection Circuit for System-Level ESD Protection and Its On-Board Behavior with EMI/EMC Filters
|
Ker, Ming-Dou; Liao, Chi-Sheng; Yen, Cheng-Cheng |
| 國立交通大學 |
2014-12-08T15:03:56Z |
Transient-to-Digital Converter for ESD Protection Design in Microelectronic Systems
|
Ker, Ming-Dou; Yen, Cheng-Cheng; Liao, Chi-Sheng; Chen, Tung-Yang; Tsai, Chih-Chung |
| 義守大學 |
2009 |
Transient-to-digital converter for protection design in CMOS integrated circuits against electrical fast transient
|
Yen, Cheng-Cheng ; Ker, Ming-Dou ; Liao, Chi-Sheng ; Chen, Tung-Yang ; Tsai, Chih-Chung |
