| 國立交通大學 |
2018-08-21T05:56:38Z |
Protection Design Against System-Level ESD Transient Disturbance on Display Panels
|
Ker, Ming-Dou; Lin, Wan-Yen; Yen, Cheng-Cheng; Yang, Che-Ming; Chen, Tung-Yang; Chen, Shih-Fan |
| 國立交通大學 |
2015-05-12T02:59:35Z |
Self-reset transient-to-digital convertor and electronic product utilizing the same
|
Ker Ming-Dou; Yen Cheng-Cheng; Chen Tung-Yang; Tsai Ching-Ling; Chen Shih-Fan |
| 國立交通大學 |
2014-12-16T06:15:50Z |
POWER-RAIL ESD PROTECTION CIRCUIT WITHOUT LOCK-ON FAILURE
|
Ker, Ming-Dou; Yen, Cheng-Cheng; Chen, Tung-Yang |
| 國立交通大學 |
2014-12-16T06:15:47Z |
TRANSIENT DETECTION CIRCUIT FOR ESD PROTECTION
|
Ker, Ming-Dou; Yen, Cheng-Cheng; Liao, Chi-Sheng; Chen, Tung-Yang |
| 國立交通大學 |
2014-12-16T06:15:46Z |
TRANSIENT TO DIGITAL CONVERTERS
|
Ker, Ming-Dou; Yen, Cheng-Cheng; Liao, Chi-Sheng; Chen, Tung-Yang |
| 國立交通大學 |
2014-12-16T06:15:45Z |
TRANSIENT DETECTION CIRCUIT
|
Ker, Ming-Dou; Yen, Cheng-Cheng; Liao, Chi-Sheng; Chen, Tung-Yang |
| 國立交通大學 |
2014-12-16T06:15:06Z |
On-Chip Noise Filter Circuit
|
Ker Ming-Dou; Yen Cheng-Cheng; Chen Tung-Yang |
| 國立交通大學 |
2014-12-16T06:14:58Z |
SELF-RESET TRANSIENT-TO-DIGITAL CONVERTOR AND ELECTRONIC PRODUCT UTILIZING THE SAME
|
KER MING-DOU; Yen Cheng-Cheng; CHEN Tung-Yang; Tsai Ching-Ling; Chen Shih-Fan |
| 國立交通大學 |
2014-12-16T06:13:54Z |
On-chip noise filter circuit
|
Ker Ming-Dou; Yen Cheng-Cheng; Chen Tung-Yang |
| 國立交通大學 |
2014-12-12T03:03:55Z |
互補式金氧半積體電路之系統層級靜電放電防護設計
|
顏承正; Yen, Cheng-Cheng; 柯明道; Ker, Ming-Dou |
| 國立交通大學 |
2014-12-08T15:48:09Z |
New Transient Detection Circuit for On-Chip Protection Design Against System-Level Electrical-Transient Disturbance
|
Ker, Ming-Dou; Yen, Cheng-Cheng |
| 國立交通大學 |
2014-12-08T15:42:19Z |
Investigation and Design of On-Chip Power-Rail ESD Clamp Circuits Without Suffering Latchup-Like Failure During System-Level ESD Test
|
Ker, Ming-Dou; Yen, Cheng-Cheng |
| 國立交通大學 |
2014-12-08T15:35:09Z |
SCR-based transient detection circuit for on-chip protection design against system-level electrical transient disturbance
|
Ker, Ming-Dou; Lin, Wan-Yen; Yen, Cheng-Cheng |
| 國立交通大學 |
2014-12-08T15:25:03Z |
System-level ESD protection design with on-chip transient detection circuit
|
Yen, Cheng-Cheng; Ker, Ming-Dou; Shih, Pi-Chia |
| 國立交通大學 |
2014-12-08T15:24:43Z |
On-chip transient detection circuit for system-level ESD protection in CMOS ICs
|
Ker, Ming-Dou; Yen, Cheng-Cheng; Shih, Pi-Chia |
| 國立交通大學 |
2014-12-08T15:22:57Z |
Transient-to-Digital Converter for Protection Design in CMOS Integrated Circuits against Electrical Fast Transient
|
Yen, Cheng-Cheng; Ker, Ming-Dou; Liao, Chi-Sheng; Chen, Tung-Yang; Tsai, Chih-Chung |
| 國立交通大學 |
2014-12-08T15:22:31Z |
On-chip detection circuit for protection design in display panel against electrical fast transient (EFT) disturbance
|
Yen, Cheng-Cheng; Ker, Ming-Dou; Lin, Wan-Yen; Yang, Che-Ming; Chen, Shih-Fan; Chen, Tung-Yang |
| 國立交通大學 |
2014-12-08T15:20:53Z |
New 4-Bit Transient-to-Digital Converter for System-Level ESD Protection in Display Panels
|
Ker, Ming-Dou; Yen, Cheng-Cheng |
| 國立交通大學 |
2014-12-08T15:15:15Z |
Latchup-like failure of power-rail ESD clamp circuits in CMOS integrated circuits under system-level ESD test
|
Ker, Ming-Dou; Yen, Cheng-Cheng |
| 國立交通大學 |
2014-12-08T15:15:12Z |
Failure of on-chip power-fall ESD clamp circuits during system-level ESD test
|
Yen, Cheng-Cheng; Ker, Ming-Dou |
| 國立交通大學 |
2014-12-08T15:12:38Z |
Transient-induced latchup in CMOS integrated circuits due to electrical fast transient (EFT) test
|
Yen, Cheng-Cheng; Ker, Ming-Dou |
| 國立交通大學 |
2014-12-08T15:12:37Z |
On-chip transient detection circuit for system-level ESD protection in CMOS integrated circuits to meet electromagnetic compatibility regulation
|
Ker, Ming-Dou; Yen, Cheng-Cheng; Shih, Pi-Chia |
| 國立交通大學 |
2014-12-08T15:11:44Z |
Unexpected failure in power-rail ESD clamp circuits of CMOS integrated circuits in microelectronics systems during electrical fast transient (EFT) test and the re-design solution
|
Ker, Ming-Dou; Yen, Cheng-Cheng |
| 國立交通大學 |
2014-12-08T15:09:25Z |
Transient-Induced Latchup in CMOS ICs Under Electrical Fast-Transient Test
|
Yen, Cheng-Cheng; Ker, Ming-Dou; Chen, Tung-Yang |
| 國立交通大學 |
2014-12-08T15:09:25Z |
The Effect of IEC-Like Fast Transients on RC-Triggered ESD Power Clamps
|
Yen, Cheng-Cheng; Ker, Ming-Dou |
