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Institution Date Title Author
淡江大學 2025-03-24T04:05:15Z A New Multiple Dependent State Sampling Plan Based on One-Sided Process Capability Indices Yen, Ching-ho
淡江大學 2023-11-28 Asymmetric Impact of Inverted Yield Curve, FRAC Spread Count, and Billings Trends for Semiconductor Equipment Manufacturers on SOX Index Yen, Ching-ho
淡江大學 2020-01-20 A Rectifying Acceptance Sampling Plan Based on the Process Capability Index Yen, Ching-ho
國立交通大學 2014-12-08T15:21:23Z Production yield measure for multiple characteristics processes based on S-pk(T) under multiple samples Pearn, W. L.; Yen, Ching-Ho; Yang, Dong-Yuh

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