|
"yen guo ji"的相關文件
顯示項目 1-7 / 7 (共1頁)
1
每頁顯示[10|25|50]項目
| 國立臺灣大學 |
2012 |
Parallel detection, quantification, and depth profiling of peptides with dynamic-secondary ion mass spectrometry (D-SIMS) ionized by C-60(+)-Ar+ co-sputtering
|
Chang, Chi-Jen; Chang, Hsun-Yun; You, Yun-Wen; Liao, Hua-Yang; Kuo, Yu-Ting; Kao, Wei-Lun; Yen, Guo-Ji; Tsai, Meng-Hung; Shyue, Jing-Jong |
| 國立臺灣大學 |
2011 |
Molecular dynamic-secondary ion mass spectrometry (D-SIMS) ionized by co-sputtering with C-60(+) and Ar+
|
You, Yun-Wen; Chang, Hsun-Yun; Lin, Wei-Chun; Kuo, Che-Hung; Lee, Szu-Hsian; Kao, Wei-Lun; Yen, Guo-Ji; Chang, Chi-Jen; Liu, Chi-Ping; Huang, Chih-Chieh; Liao, Hua-Yang; Shyue, Jing-Jong |
| 國立臺灣大學 |
2011 |
Molecular migration behaviors in organic light-emitting diodes with different host structures
|
Liu, Chi-Ping; Wang, Wei-Ben; Lin, Cheng-Wei; Lin, Wei-Chun; Liu, Chia-Yi; Kuo, Che-Hung; Lee, Szu-Hsian; Kao, Wei-Lun; Yen, Guo-Ji; You, Yun-Wen; Chang, Hsun-Yun; Jou, Jwo-Huei; Shyue, Jing-Jong |
| 國立臺灣大學 |
2011 |
ToF-SIMS imaging of the nanoscale phase separation in polymeric light emitting diodes: Effect of nanostructure on device efficiency
|
Yu, Bang-Ying; Kuo, Che-Hung; Wang, Wei-Ben; Yen, Guo-Ji; Iida, Shin-ichi; Chen, Sun-Zen; Lin, Wei-Chun; Lee, Szu-Hsian; Kao, Wei-Lun; Liu, Chia-Yi; Chang, Hsun-Yun; You, Yun-Wen; Chang, Chi-Jen; Liu, Chi-Ping; Jou, Jwo-Huei; Shyue, Jing-Jong |
| 國立臺灣大學 |
2011 |
The role of the auxiliary atomic ion beam in C-60(+)-Ar+ co-sputtering
|
Lin, Wei-Chun; Liu, Chi-Ping; Kuo, Che-Hung; Chang, Hsun-Yun; Chang, Chi-Jen; Hsieh, Tung-Han; Lee, Szu-Hsian; You, Yun-Wen; Kao, Wei-Lun; Yen, Guo-Ji; Huang, Chih-Chieh; Shyue, Jing-Jong |
| 國立臺灣大學 |
2011 |
Effect of the chemical composition on the work function of gold substrates modified by binary self-assembled monolayers
|
Lee, Szu-Hsian; Lin, Wei-Chun; Chang, Chi-Jen; Huang, Chih-Chieh; Liu, Chi-Ping; Kuo, Che-Hung; Chang, Hsun-Yun; You, Yun-Wen; Kao, Wei-Lun; Yen, Guo-Ji; Kuo, Ding-Yuan; Kuo, Yu-Ting; Tsai, Meng-Hung; Shyue, Jing-Jong |
| 國立臺灣大學 |
2010 |
Effect of Fabrication Parameters on Three-Dimensional Nanostructures of Bulk Heterojunctions Imaged by High-Resolution Scanning ToF-SIMS
|
Yu, Bang-Ying; Lin, Wei-Chun; Wang, Wei-Ben; Iida, Shin-ichi; Chen, Sun-Zen; Liu, Chia-Yi; Kuo, Che-Hung; Lee, Szu-Hsian; Kao, Wei-Lun; Yen, Guo-Ji; You, Yun-Wen; Liu, Chi-Ping; Jou, Jwo-Huei; Shyue, Jing-Jong |
顯示項目 1-7 / 7 (共1頁)
1
每頁顯示[10|25|50]項目
|
