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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
國立交通大學 2014-12-08T15:27:09Z An accurate hot carrier reliability monitor for deep-submicron shallow S/D junction thin gate oxide n-MOSFET's Chung, SS; Chen, SJ; Yih, CM; Yang, WJ; Chao, TS
國立交通大學 2014-12-08T15:26:55Z N-channel versus P-channel flash EEPROM - Which one has better reliabilities Chung, SS; Liaw, ST; Yih, CM; Ho, ZH; Lin, CJ; Kuo, DS; Liang, MS
國立交通大學 2014-12-08T15:01:20Z A unified approach to profiling the lateral distributions of both oxide charge and interface states in n-MOSFET's under various bias stress conditions Cheng, SM; Yih, CM; Yeh, JC; Kuo, SN; Chung, SS

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