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Taiwan Academic Institutional Repository >
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"yoo woo sik"
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| 國立成功大學 |
2012-09 |
Non-contact monitoring of Ge and B diffusion in B-doped epitaxial Si1-xGex bi-layers on silicon substrates during rapid thermal annealing by multiwavelength Raman spectroscopy
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Hong, Min-Hao; Chang, Chun-Wei; Perng, Dung-Ching; Lee, Kuan-Ching; Jian, Shiu-Ko Jang; Lee, Wei-Fan; Chuang, Yen; Fan, Yu-Ta; Yoo, Woo Sik |
| 國立成功大學 |
2012 |
Room Temperature Photoluminescence and Ultraviolet Raman Characterization of Boron Implanted Silicon under Various Laser Annealing Conditions
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Hong, Min-Hao; Perng, Dung-Ching; Jian, Jang Shiu-Ko; Yoo, Woo Sik |
Showing items 1-2 of 2 (1 Page(s) Totally)
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