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"young t f"
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| 國立交通大學 |
2014-12-08T15:08:57Z |
Thermal analysis on the degradation of poly-silicon TFTs under AC stress
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Weng, C. F.; Chang, T. C.; Tai, Y. H.; Huang, S. T.; Wu, K. T.; Chen, C. W.; Kuo, W. C.; Young, T. F. |
| 國立高雄應用科技大學 |
2012-12 |
Bipolar resistive RAM characteristics induced by nickel incorporated into silicon oxide dielectrics for IC applications
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Tsai, T. M.;K. C. Chang;Chang, T. C.;Syu, Y. E.;Chuang, S. L.;Chang, G. W.;Liu, G. R.;Chen, M. C.;Huang, H. C.;Liu, S. K.;Tai, Y. H.;Gan, D. S.;Yang, Y. L.;Young, T. F.;Tseng, B. H.;Chen, K. H.;Tsai, M. J.;C. Ye, H. Wang;Sze, S.M. |
| 淡江大學 |
2009-01 |
Substrate current enhancement in 65 nm metal-oxide-silicon field-effect transistor under external mechanical stress
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Kuo, Y. J.; Chang, T. C.; 葉炳宏; Yeh, P. H.;Chen, S. C.; Dai, C. H.; Chao, C. H.; Young, T. F.; Cheng, Osbert; Huan, C. T. |
| 國立成功大學 |
2002-08-22 |
Combined magnetron sputtering and ECR-CVD deposition of diamond-like carbon films
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Chang, J. F.; Ueng, H. Y.; Young, T. F.; Wang, Y. C.; Hwang, Wen-Chi |
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