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机构 日期 题名 作者
國立交通大學 2019-12-13T01:12:54Z Benchmarking of Monolayer and Bilayer Two-Dimensional Transition Metal Dichalcogenide (TMD) Based Logic Circuits and 6T SRAM Cells Yu, Chang-Hung; Su, Pin; Chuang, Ching-Te
國立交通大學 2019-04-03T06:44:23Z New Findings on the Drain-Induced Barrier Lowering Characteristics for Tri-Gate Germanium-on-Insulator p-MOSFETs Wu, Shu-Hua; Yu, Chang-Hung; Su, Pin
國立交通大學 2019-04-03T06:35:52Z Theoretical Investigation of DIBL Characteristics for Scaled Tri-Gate InGaAs-OI n-MOSFETs Including Sensitivity to Process Variations Wu, Shu-Hua; Yu, Chien-Lin; Yu, Chang-Hung; Su, Pin
國立交通大學 2018-08-21T05:56:52Z Evaluation of Analog Performance of Monolayer and Bilayer Two-Dimensional Transition Metal Dichalcogenide (TMD) MOSFETs Lee, Hung-Yi; Yu, Chang-Hung; Su, Pin; Chuang, Ching-Te
國立交通大學 2018-08-21T05:56:52Z Performance Evaluation of Pass-Transistor-Based Circuits using Monolayer and Bilayer 2-D Transition Metal Dichalcogenide (TMD) MOSFETs for 5.9nm Node Yu, Chang-Hung; Zheng, Jun-Teng; Su, Pin; Chuang, Ching-Te
國立交通大學 2018-08-21T05:53:58Z Performance and Stability Benchmarking of Monolithic 3-D Logic Circuits and SRAM Cells With Monolayer and Few-Layer Transition Metal Dichalcogenide MOSFETs Yu, Chang-Hung; Su, Pin; Chuang, Ching-Te
國立交通大學 2018-01-24T07:38:51Z 超薄絕緣層異質三五族與鍺通道金氧半場效電晶體及單層與多層二維過渡金屬硫屬化合物之邏輯電路及靜態隨機存取記憶體之研究與分析 余昌鴻; 蘇彬; Yu, Chang-Hung; Su, Pin
國立交通大學 2017-04-21T06:56:15Z Impact of Random Variations on Cell Stability and Write-Ability of Low-Voltage SRAMs Using Monolayer and Bilayer Transition Metal Dichalcogenide (TMD) MOSFETs Yu, Chang-Hung; Su, Pin; Chuang, Ching-Te
國立交通大學 2017-04-21T06:50:14Z Anomalous Electrostatics and Intrinsic Variability in GeOI p-MOSFET Yu, Chang-Hung; Su, Pin
國立交通大學 2017-04-21T06:49:44Z Built-in Effective Body-Bias Effect in UTBB Hetero-Channel MOSFETs and Its Suppression Yu, Chang-Hung; Su, Pin

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