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"yu m a"
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| 臺大學術典藏 |
2019-03-11T08:01:09Z |
Publisher's note: "Optimization of dislocation edge stress effects for Si N-type metal-oxide-semiconductor field-effect transistors" [Jpn. J. Appl. Phys. 52, 04CC20 (2013)]
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Kao, S.-C.;Liu, G.-H.;Yu, M.-A.;Yang, C.;Chang, L.-C.;Chen, C.-H.;Liao, M.-H.; Liao, M.-H.; Chen, C.-H.; Chang, L.-C.; Yang, C.; Yu, M.-A.; Liu, G.-H.; Kao, S.-C. |
| 臺大學術典藏 |
2019-03-11T08:01:09Z |
Publisher's note: "Optimization of dislocation edge stress effects for Si N-type metal-oxide-semiconductor field-effect transistors" [Jpn. J. Appl. Phys. 52, 04CC20 (2013)]
|
Kao, S.-C.;Liu, G.-H.;Yu, M.-A.;Yang, C.;Chang, L.-C.;Chen, C.-H.;Liao, M.-H.; Liao, M.-H.; Chen, C.-H.; Chang, L.-C.; Yang, C.; Yu, M.-A.; Liu, G.-H.; Kao, S.-C. |
Showing items 1-2 of 2 (1 Page(s) Totally)
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