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Taiwan Academic Institutional Repository >
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"yu shao ming"
Showing items 26-32 of 32 (2 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:08:33Z |
Characteristic fluctuation dependence on discrete dopant for 16nm SOI FinFETs at different temperature
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Li, Yiming; Hwang, Chih-Hong; Yu, Shao-Ming; Huang, Hsuan-Ming; Yeh, Ta-Ching; Cheng, Hui-Wen; Chen, Hung-Ming; Hwang, Jiunn-Ren; Yang, Fu-Liang |
| 國立交通大學 |
2014-12-08T15:07:06Z |
Numerical simulation of static noise margin for a six-transistor static random access memory cell with 32nm fin-typed field effect transistors
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Li, Yiming; Hwang, Chih-Hong; Yu, Shao-Ming |
| 國立交通大學 |
2014-12-08T15:06:44Z |
An optimal silicidation technique for electrostatic discharge protection sub-100 nm CMOS devices in VLSI circuit
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Yu, Shao-Ming; Lee, Jam-Wen; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:05:52Z |
Analytical solution of nonlinear Poisson equation for symmetric double-gate metal-oxide-semiconductor field effect transistors
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Lo, Shih-Ching; Li, Yiming; Yu, Shao-Ming |
| 國立交通大學 |
2014-12-08T15:05:34Z |
Process-variation- and random-dopants-induced threshold voltage fluctuations in nanoscale CMOS and SOI devices
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Li, Yiming; Yu, Shao-Ming; Chen, Hung-Ming |
| 國立交通大學 |
2014-12-08T15:05:19Z |
A coupled-simulation-and-optimization approach to nanodevice fabrication with minimization of electrical characteristics fluctuation
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Li, Yiming; Yu, Shao-Ming |
| 國立成功大學 |
2012-07-02 |
探討儒家五常思想對後進者企業績效之影響–以台灣高科技產業為例
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余紹銘; Yu, Shao-Ming |
Showing items 26-32 of 32 (2 Page(s) Totally)
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