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"yuan f"
Showing items 21-29 of 29 (3 Page(s) Totally)
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| 臺大學術典藏 |
2018-09-10T04:13:01Z |
Roughness-enhanced reliability of MOS tunneling diodes
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Lin, C.-H.; Yuan, F.; Shie, C.-R.; Chen, K.-F.; Hsu, B.-C.; Lee, M.H.; Pai, W.W.; Liu, C.W.; CHEE-WEE LIU |
| 國立臺灣大學 |
2007 |
Hole mobility enhancement of Si0.2Ge0.8 quantum well channel on Si
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Peng, C.-Y.; Yuan, F.; Yu, C.-Y.; Kuo, P.-S.; Lee, M. H.; Maikap, S.; Hsu, C.-H.; Liu, C. W. |
| 國立臺灣大學 |
2006 |
Mechanical strain effect of n-channel polycrystalline silicon thin-film transistors
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Huang, C.-F.; Yang, Y.-J.; Peng, C.-Y.; Yuan, F.; Liu, C. W. |
| 國立臺灣大學 |
2004-05 |
Bandwidth Enhancement in an Integratable SiGe Phototransistor by Removal of Excess Carriers
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Pei, Z.; Shi, J.W.; Hsu, Y.M.; Yuan, F.; Liang, C.S.; Lu, S.C.; Hsieh, W.Y.; Tsai, M.J.; Liu, C.W. |
| 國立臺灣大學 |
2004 |
Mechanically strained Si/SiGe HBTs
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Yuan, F.; Jan, S.-R.; Maikap, S.; Liu, Y.-H.; Liang, C.-S.; Liu, C.W. |
| 國立臺灣大學 |
2004 |
Performance Enhancement of High-Speed SiGe Based Heterojunction Phototransistor with Substrate Terminal
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Shi, Jin-Wei; Pei, Z.; Yuan, F.; Hsu, Y.-M.; Liu, C.-W.; Lu, S. C.; Tsai, M.-J. |
| 國立臺灣大學 |
2003-12 |
Mextram modeling of Si/SiGe heterojunction phototransistors
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Yuan, F.; Pei, Z.; Shi, J.W.; Chang, S.T.; Liu, C.W. |
| 國立臺灣大學 |
2003 |
Isotope effect of hydrogen release in metal/oxide/n-silicon tunneling diodes
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Lin, C. -H.; Yuan, F.; Hsu, B. -C.; Liu, C. W. |
| 國立臺灣大學 |
2002 |
Roughness- Enhanced Reliability of MOS Tunneling Diodes
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Lin, C.-H.; Yuan, F.; Shie, C.-R.; Chen, K.-F.; Hsu, B.-C.; Lee, M.H.; Pai, W.W.; Liu, C.W. |
Showing items 21-29 of 29 (3 Page(s) Totally)
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