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Institution Date Title Author
臺大學術典藏 2021-08-05T02:41:49Z Equipment deterioration modeling and cause diagnosis in semiconductor manufacturing Rostami H;Blue J;Chen A;Yugma C.; Rostami H; Blue J; Chen A; Yugma C.; JAKEY BLUE
臺大學術典藏 2021-08-05T02:41:49Z Chamber Mismatching Calibration with Adjusted Run-to-Run Regulation in Semiconductor Manufacturing Chouichi A;Blue J;Yugma C;Pasqualini F.; Chouichi A; Blue J; Yugma C; Pasqualini F.; JAKEY BLUE
臺大學術典藏 2021-08-05T02:41:47Z Equipment deterioration modeling and cause diagnosis in semiconductor manufacturing Rostami H;Blue J;Chen A;Yugma C.; Rostami H; Blue J; Chen A; Yugma C.; ARGON CHEN
臺大學術典藏 2020-03-02T06:40:10Z Integration of scheduling and advanced process control in semiconductor manufacturing: Review and outlook Yugma, C.; Blue, J.; Dauzere-P?r?s, S.; Vialletelle, P.; JAKEY BLUE
臺大學術典藏 2020-03-02T06:40:09Z Integration of scheduling and advanced process control in semiconductor manufacturing: review and outlook Yugma, C.; Blue, J.; Dauz?re-P?r?s, S.; Obeid, A.; JAKEY BLUE
臺大學術典藏 2020-03-02T06:40:07Z Automatic equipment fault fingerprint extraction for the fault diagnostic on the batch process data Rostami, H.; Blue, J.; Yugma, C.; JAKEY BLUE
臺大學術典藏 2020-03-02T06:40:07Z Heterogranular multivariate analytics for detecting and controlling the root causes of the mismatching machines in semiconductor manufacturing Chouichi, A.; Blue, J.; Yugma, C.; Pasqualini, F.; JAKEY BLUE
臺大學術典藏 2020-03-02T06:40:06Z The detection and the control of machine/chamber mismatching in semiconductormanufacturing Chouichi, A.; Blue, J.; Yugma, C.; Pasqualini, F.; JAKEY BLUE
臺大學術典藏 2020-03-02T06:40:06Z Equipment Deterioration Modeling and Causes Diagnosis in Semiconductor Manufacturing Rostami, H.; Blue, J.; Chen, A.; Yugma, C.; JAKEY BLUE
臺大學術典藏 2020-03-02T06:40:01Z Parallel machine scheduling with time constraints on machine qualifications Nattaf, M.;Dauz?re-P?r?s, S.;Yugma, C.;Wu, C.-H.; Nattaf, M.; Dauz?re-P?r?s, S.; Yugma, C.; Wu, C.-H.; CHENG-HUNG WU

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