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國立成功大學 |
2020 |
Prediction of Test Pattern Count and Test Data Volume for Scan Architectures under Different Input Channel Configurations
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Tsai, F.-J.;Ye, C.-S.;Lee, K.-J.;Zheng, S.-X.;Huang, Y.;Cheng, W.-T.;Reddy, S.M.;Kassab, M.;Rajski, J.;Wang, C.;Zawada, J. |
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