|
|
???tair.name??? >
???browser.page.title.author???
|
"zheng y z"???jsp.browse.items-by-author.description???
Showing items 1-9 of 9 (1 Page(s) Totally)
1
View [10|25|50] records per page
| 臺大學術典藏 |
2021-01-27T07:50:02Z |
The Gigantic {Ni36Gd102} Hexagon: A Sulfate-Templated "star-of-David" for Photocatalytic CO2 Reduction and Magnetic Cooling
|
Chen, W.-P.;Liao, P.-Q.;Jin, P.-B.;Zhang, L.;Ling, B.-K.;Wang, S.-C.;Chan, Y.-T.;Chen, X.-M.;Zheng, Y.-Z.; Chen, W.-P.; Liao, P.-Q.; Jin, P.-B.; Zhang, L.; Ling, B.-K.; Wang, S.-C.; Chan, Y.-T.; Chen, X.-M.; Zheng, Y.-Z.; YI-TSU CHAN |
| 臺大學術典藏 |
2021-01-27T07:50:01Z |
Terbium-fluorido cluster: An energy cage for photoluminescence
|
Ling, B.-K.;Li, J.;Zhai, Y.-Q.;Hsu, H.-K.;Chan, Y.-T.;Chen, W.-P.;Han, T.;Zheng, Y.-Z.; Ling, B.-K.; Li, J.; Zhai, Y.-Q.; Hsu, H.-K.; Chan, Y.-T.; Chen, W.-P.; Han, T.; Zheng, Y.-Z.; YI-TSU CHAN |
| 臺大學術典藏 |
2020-04-21T03:52:57Z |
X-ray multi-beam resonant diffraction analysis of crystal symmetry for layered perovskite YBaCuFeO5
|
Liu, W. C.; Zheng, Y. Z.; Chih, Y. C.; Lai, Y. C.; Tsai, Y. W.; Zheng, Y. Z.; Du, C. H.; Chou, F. C.; Soo, Y. L.; Chang, S. L. |
| 臺大學術典藏 |
2020-04-21T03:52:57Z |
X-ray multi-beam resonant diffraction analysis of crystal symmetry for layered perovskite YBaCuFeO5
|
Liu, W. C.; Zheng, Y. Z.; Chih, Y. C.; Lai, Y. C.; Tsai, Y. W.; Zheng, Y. Z.; Du, C. H.; Chou, F. C.; Soo, Y. L.; Chang, S. L. |
| 國立成功大學 |
2020 |
Influence of Hot Carriers and Illumination Stress on a-InGaZnO TFTs with Asymmetrical Geometry
|
Hung, Y.-H.;Chang, T.-C.;Chen, P.-H.;Liao, P.-Y.;Su, W.-C.;Chen, H.-C.;Tu, Y.-F.;Zheng, Y.-Z.;Lu, I.-N.;Lin, Y.-S.;Ciou, F.-M.;Tsai, Tsai T.-M. |
| 國立成功大學 |
2020 |
Improving a-InGaZnO TFTs Reliability by Optimizing Electrode Capping Structure under Negative Bias Illumination Stress
|
Tu, Y.-F.;Lu, I.-N.;Chen, H.-C.;Su, W.-C.;Hung, Y.-H.;Zhou, K.-J.;Zheng, Y.-Z.;Sun, L.-C.;Shih, Y.-S.;Chen, J.-J.;Lien, C.-Y.;Huang, Huang H.-C.;Lien, C.-H.;Chang, T.-C. |
| 國立成功大學 |
2019 |
Abnormal C-V Hump Effect Induced by Hot Carriers in Gate Length-Dependent p-Type LTPS TFTs
|
Huang, S.-P.;Shih, Y.-K.;Chung, Y.-H.;Chen, W.-H.;Wang, T.T.-J.;Zhang, S.-D.;Chang, T.-C.;Chen, P.-H.;Tsao, Y.-C.;Chen, H.-C.;Zheng, Y.-Z.;Chu, A.-K.;Shih, Y.-S.;Wang, Y.-X.;Wu, C.-C. |
| 國立成功大學 |
2019 |
Impact of Dehydrogenation Annealing Process Temperature on Reliability of Polycrystalline Silicon Thin Film Transistors
|
Huang, S.-P.;Chen, P.-H.;Chen, H.-C.;Zheng, Y.-Z.;Chu, A.-K.;Tsao, Y.-C.;Shih, Y.-S.;Wang, Y.-X.;Wu, C.-C.;Lai, W.-C.;Chang, T.-C. |
| 國立成功大學 |
2018 |
Combined Effects of Light Illumination and Various Bottom Gate Length on the Instability of Via-Contact-Type Amorphous InGaZnO Thin-Film Transistors
|
Yang, C.-I.;Chang, T.-C.;Liao, P.-Y.;Chen, B.-W.;Chou, W.-C.;Chen, G.-F.;Huang, S.-P.;Zheng, Y.-Z.;Wang, Y.-X.;Liu, H.-W.;Lin, C.-Y.;Lin, Y.-S.;Lu, Y.-H.;Zhang, S. |
Showing items 1-9 of 9 (1 Page(s) Totally)
1
View [10|25|50] records per page
|
