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Showing items 1-11 of 11 (1 Page(s) Totally)
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| 國立成功大學 |
2023 |
Application of SCF-LTDP technology for a-Si:H film defective passivation in X-ray PIN-based photosensor
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Chen, J.-J.;Chen, M.-C.;Chang, T.-C.;Chen, H.-C.;Zhou, K.-J.;Kuo, C.-W.;Yang, C.-C.;Wu, P.-Y.;Shih, C.-C.;Huang, J.-W. |
| 國立成功大學 |
2021 |
Vertical Electric Field-Induced Abnormal Capacitance-Voltage Electrical Characteristics in a-InGaZnO TFTs
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Kuo, C.-W.;Chang, T.-C.;Chen, H.-C.;Tsao, Y.-C.;Chen, J.-J.;Zhou, K.-J.;Wu, Wu W.-C.;Li, H.-C.;Lin, C.-C.;Zhang, Y.-C.;Tsai, Tsai T.-M.;Huang, J.-W. |
| 國立成功大學 |
2021 |
Degradation Behavior of Etch-Stopper-Layer Structured a-InGaZnO Thin-Film Transistors under Hot-Carrier Stress and Illumination
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Lin, D.;Su, W.-C.;Chang, T.-C.;Chen, H.-C.;Tu, Y.-F.;Zhou, K.-J.;Hung, Y.-H.;Yang, J.;Lu, I.-N.;Tsai, Tsai T.-M.;Zhang, Q. |
| 國立成功大學 |
2020 |
Enhancing hot-carrier reliability of dual-gate low-Temperature polysilicon tfts by increasing lightly doped drain length
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Chen, J.-J.;Chang, T.-C.;Chen, H.-C.;Zhou, K.-J.;Kuo, C.-W.;Wu, Wu W.-C.;Li, H.-C.;Tai, M.-C.;Tu, Y.-F.;Tsai, Y.-L.;Wu, P.-Y.;Sze, Sze S.M. |
| 國立成功大學 |
2020 |
Improving a-InGaZnO TFTs Reliability by Optimizing Electrode Capping Structure under Negative Bias Illumination Stress
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Tu, Y.-F.;Lu, I.-N.;Chen, H.-C.;Su, W.-C.;Hung, Y.-H.;Zhou, K.-J.;Zheng, Y.-Z.;Sun, L.-C.;Shih, Y.-S.;Chen, J.-J.;Lien, C.-Y.;Huang, Huang H.-C.;Lien, C.-H.;Chang, T.-C. |
| 國立成功大學 |
2020 |
Abnormal threshold voltage shift caused by trapped holes under hot-carrier stress in a-IGZO TFTs
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Shao, J.;Su, W.-C.;Chang, T.-C.;Chen, H.-C.;Zhou, K.-J.;Lu, I.-N.;Tu, Y.-F.;Shih, Y.-S.;Tsai, Tsai T.-M.;Lien, C.-H.;Yang, J.;Zhang, Q. |
| 國立成功大學 |
2020 |
Abnormal Hump Effect Induced by Hydrogen Diffusion during Self-Heating Stress in Top-Gate Amorphous InGaZnO TFTs
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Chen, H.-C.;Chen, J.-J.;Tu, Y.-F.;Zhou, K.-J.;Kuo, C.-W.;Su, W.-C.;Hung, Y.-H.;Shih, Y.-S.;Huang, Huang H.-C.;Tsai, Tsai T.-M.;Huang, J.-W.;Lai, W.-C.;Chang, T.-C. |
| 國立成功大學 |
2020 |
Effects of Redundant Electrode Width on Stability of a-InGaZnO Thin-Film Transistors under Hot-Carrier Stress
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Lin, D.;Su, W.-C.;Chang, T.-C.;Chen, H.-C.;Tu, Y.-F.;Yang, J.;Zhou, K.-J.;Hung, Y.-H.;Lu, I.-N.;Tsai, Tsai T.-M.;Zhang, Q. |
| 國立成功大學 |
2020 |
Inhibiting the Kink Effect and Hot-Carrier Stress Degradation Using Dual-Gate Low-Temperature Poly-Si TFTs
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Chen, H.-C.;Tu, H.-Y.;Huang, Huang H.-C.;Lai, W.-C.;Chang, T.-C.;Huang, S.-P.;Tu, Y.-F.;Kuo, C.-W.;Zhou, K.-J.;Chen, J.-J.;Shih, Y.-S.;Chen, G.-F.;Su, W.-C. |
| 國立成功大學 |
2020 |
Abnormal High Resistive State Current Mechanism Transformation in Ti/HfO2/TiN Resistive Random Access Memory
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Zhou, K.-J.;Tan, Y.-F.;Wu, C.-W.;Yeh, Yeh Y.-H.;Sze, Sze S.M.;Chang, T.-C.;Lin, C.-Y.;Chen, Chen C.-K.;Tseng, Y.-T.;Zheng, H.-X.;Chen, H.-C.;Sun, L.-C.;Lien, C.-Y. |
| 國立成功大學 |
2019 |
Abnormal Back Channel Leakage under Large Drain Voltage in Short Channel Organic Thin-Film Transistors
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Chen, G.-F.;Lin, S.-C.;Yu, M.-C.;Chuang, Y.-C.;Zhang, S.;Chen, H.-C.;Chang, T.-C.;Huang, S.-P.;Zhou, K.-J.;Chen, J.-J.;Kuo, C.-W.;Su, W.-C.;Tsao, Y.-C. |
Showing items 1-11 of 11 (1 Page(s) Totally)
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