臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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	Repositories
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	2019臺灣學術機構典藏研討會
	機構典藏系統RC7版本已發佈

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	機構典藏計畫網站
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	臺大學術典藏NTU Scholars

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Showing items 1996446-1996455 of 2348904 (234891 Page(s) Totally)
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Institution	Date	Title	Author
臺大學術典藏	2018-09-10T08:18:19Z	Automatic Key Term Extraction From Spoken Course Lectures Using Branching Entropy and Prosodic/Semantic Features	Yun-Nung Chen;Yu Huang;Sheng-Yi Kong;Lin-shan Lee; Yun-Nung Chen; Yu Huang; Sheng-Yi Kong; Lin-shan Lee; LIN-SHAN LEE
臺大學術典藏	2018-09-10T08:18:19Z	A Framework Integrating Different Relevance Feedback Scenarios and Approaches For Spoken Term Detection	Hung-Yi Lee;Chia-Ping Chen;Ching-Feng Yeh;Lin-shan Lee; Hung-Yi Lee; Chia-Ping Chen; Ching-Feng Yeh; Lin-shan Lee; HUNG-YI LEE; LIN-SHAN LEE
臺大學術典藏	2018-09-10T08:18:19Z	Manufacturability analysis of a micro-electro-mechanical systems–based electron-optical system design for direct-write lithography	Sheng-Yung Chen;Shin-Chuan Chen;Hsing-Hong Chen;Kuen-Yu Tsai;Hsin-Hung Pan; Sheng-Yung Chen; Shin-Chuan Chen; Hsing-Hong Chen; Kuen-Yu Tsai; Hsin-Hung Pan; KUEN-YU TSAI
臺大學術典藏	2018-09-10T08:18:20Z	Fresnel zone plate manufacturability analysis for direct-write lithography by simulating focusing and patterning performance versus fabrication errors	Kuen-Yu Tsai; Sheng-Yung Chen; Ting-Han Pei; Jia-Han Li; KUEN-YU TSAI; Kuen-Yu Tsai;Sheng-Yung Chen;Ting-Han Pei;Jia-Han Li
臺大學術典藏	2018-09-10T08:18:20Z	Stochastic simulation of photon propagation in Si for extreme-ultraviolet mask-defect inspection	Pei, Ting-Hang;Tsai, Kuen-Yu;Li, Jia-Han; Pei, Ting-Hang; Tsai, Kuen-Yu; Li, Jia-Han; Tsai, Kuen-Yu; Li, Jia-Han; Cheng, I-Chun
臺大學術典藏	2018-09-10T08:18:20Z	Efficient scattering simulations for equivalent extreme ultraviolet mask multilayer structures by modified transmission line theory and finite-difference time-domain method	Yen-Min Lee;Jia-Han Li;Philip C. W. Ng;Ting-Hang Pei;Fu-Min Wang;Kuen-Yu Tsai;Alek C. Chen; Yen-Min Lee; Jia-Han Li; Philip C. W. Ng; Ting-Hang Pei; Fu-Min Wang; Kuen-Yu Tsai; Alek C. Chen; KUEN-YU TSAI
臺大學術典藏	2018-09-10T08:18:20Z	A new method to improve accuracy of parasitics extraction considering sub-wavelength lithography effects	Kuen-Yu Tsai;Wei-Jhih Hsieh;Yuan-Ching Lu;Bo-Sen Chang;Sheng-Wei Chien;Yi-Chang Lu; Kuen-Yu Tsai; Wei-Jhih Hsieh; Yuan-Ching Lu; Bo-Sen Chang; Sheng-Wei Chien; Yi-Chang Lu; YI-CHANG LU; KUEN-YU TSAI
臺大學術典藏	2018-09-10T08:18:21Z	Stochastic simulation of photon scattering for EUV mask defect inspection	Ting-Hang Pei;Kuen-Yu Tsai;Jia-Han Li; Ting-Hang Pei; Kuen-Yu Tsai; Jia-Han Li; KUEN-YU TSAI
臺大學術典藏	2018-09-10T08:18:21Z	Model-based proximity effect correction for electron-beam direct-write lithography	Yu-Tian Shen; Kuen-Yu Tsai; KUEN-YU TSAI; Chun-Hung Liu;Pei-Lin Tien;Philip C. W. Ng;Yu-Tian Shen;Kuen-Yu Tsai; Chun-Hung Liu; Pei-Lin Tien; Philip C. W. Ng
臺大學術典藏	2018-09-10T08:18:21Z	A non-delta-chrome OPC methodology for process models with three-dimensional mask effects	Philip C. W. Ng;Kuen-Yu Tsai;Chih-Hsien Tang;Lawrence S. Melvin III; Philip C. W. Ng; Kuen-Yu Tsai; Chih-Hsien Tang; Lawrence S. Melvin III; KUEN-YU TSAI

Showing items 1996446-1996455 of 2348904 (234891 Page(s) Totally)
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