| 臺大學術典藏 |
2020-03-02T06:40:00Z |
Optimal levels of process parameters for products with multiple characteristics
|
Elsayed, E.A.; Chen, A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:40:00Z |
Applications of quantitative methods in semiconductor manufacturing
|
Moench, Lars; Chen, Argon; Ham, Andy; Morrison, James; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:59Z |
A self-tuning run-by-run process controller for processes subject to random disturbances
|
Guo, R.-S.; Chen, J.-J.; Chen, A.; Lu, S.-S.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:59Z |
Run-to-run control schemes for CMP process subject to deterministic drifts
|
Guo, R.-S.; Chen, A.; Chen, J.-J.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:59Z |
An effective SPC approach to monitoring semiconductor quality data with multiple variation sources
|
Chen, A.; Guo, R.-S.; Yeh, P.-C.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:59Z |
Function-based cost modeling for wafer manufacturing and its application to strategic management
|
Guo, R.-S.; Chen, A.; Lin, P.-L.; Shih, Y.-C.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:59Z |
Modeling and optimization of wafer-level spatial uniformity with the use of rational subgrouping
|
Guo, R.-S.; Chen, A.; Liu, C.; Lin, A.; Lan, M.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:58Z |
Age-based double EWMA controller and its application to a CMP process
|
Chen, A.; Guo, R.-S.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:58Z |
Recipe-independent tool health indicator and fault prognosis
|
Chen, A.; Blue, J.; Chou, T.-C.; Yang, T.-K.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:58Z |
A quadratic goal programming model and sensitivity analysis for semiconductor supply chain
|
Chiang, D.; Guo, R.-S.; Chen, A.; Chen, C.-B.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:58Z |
Sample Efficient Regression Trees (SERT) for yield loss analysis
|
Chen, A.; Hong, A.; Ho, O.; Liu, C.-W.; Huang, Y.-H.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:58Z |
Design and performance analysis ofthe exponentially weighted moving average mean estimate for processes subject to random step changes
|
Chen, A.; Elsayed, E.A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:58Z |
Data mining and fault diagnosis based on wafer acceptance test data and in-line manufacturing data
|
Fan, C.-M.; Guo, R.-S.; Chen, A.; Hsu, K.-C.; Wei, C.-S.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:57Z |
Priority behavior modeling of fab for supply chain management
|
Chang, S.-C.; Liao, B.-J.; Chen, A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:57Z |
Recipe-independent indicator for tool health diagnosis and predictive maintenance
|
Chen, A.; Blue, J.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:57Z |
Optimal sampling in design of experiment for simulation-based stochastic optimization
|
Brantley, M.W.; Lee, L.H.; Chen, C.-H.; Chen, A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:57Z |
Statistical multi-objective optimization and its application to IC layout design for E-tests
|
Chen, A.; Chen, V.; Hsu, C.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:57Z |
Optimal supply chain configurations in semiconductor manufacturing
|
Chiang, D.; Guo, R.-S.; Chen, A.; Cheng, M.-T.; Chen, C.-B.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:56Z |
Priority cycle time behavior modeling for semiconductor fabs
|
Chang, S.-C.; Liao, B.-J.; Kao, Y.-T.; Chen, A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:56Z |
Rare-event splitting simulation for analysis of power system blackouts
|
Wang, S.-P.; Chen, A.; Liu, C.-W.; Chen, C.-H.; Shortle, J.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:56Z |
Computerized Detection and Quantification of Microcalcifications in Thyroid Nodules
|
Chen, K.-Y.; Chen, C.-N.; Wu, M.-H.; Ho, M.-C.; Tai, H.-C.; Huang, W.-C.; Chung, Y.-C.; Chen, A.; Chang, K.-J.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:56Z |
The conservation network of horseshoe crab Tachypleus tridentatus in Taiwan
|
Chen, C.-P.; Hsieh, H.-L.; Chen, A.; Yeh, H.-Y.; Lin, P.-F.; Wang, W.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:56Z |
Optimum sampling for track PEB CD integrated metrology
|
Chen, A.; Hsueh, S.; Blue, J.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:55Z |
Efficient simulation budget allocation with regression
|
Brantley, M.W.; Lee, L.H.; Chen, C.-H.; Chen, A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:55Z |
Dominance index for many-to-many correlation and its applicaions to semiconductor yield analysis
|
Hong, A.; Chen, A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:55Z |
Piecewise regression model construction with sample efficient regression tree (SERT) and applications to semiconductor yield analysis
|
Hong, A.; Chen, A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:55Z |
Test of covariance changes without a large sample and its application to fault detection and classification
|
Hung, H.; Chen, A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:54Z |
Determining the influence of age and diabetes on the second-harmonic generation strength of dermal collagen fibers in vivo by using electronic noises
|
Hung, W.-C.; Sun, C.-K.; Chen, A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:54Z |
A variance-reduction method for thyroid nodule boundary detection on ultrasound images
|
Chiu, L.-Y.; Chen, A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:54Z |
Efficient Splitting Simulation for Blackout Analysis
|
Wang, S.-P.; Chen, A.; Liu, C.-W.; Chen, C.-H.; Shortle, J.; Wu, J.-Y.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:54Z |
Applications of quantitative methods in semiconductor manufacturing
|
M?nch, L.; Chen, A.; Ham, A.; Morrison, J.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:54Z |
Computerized Quantification of Ultrasonic Heterogeneity in Thyroid Nodules
|
Chen, K.-Y.; Chen, C.-N.; Wu, M.-H.; Ho, M.-C.; Tai, H.-C.; Kuo, W.-H.; Huang, W.-C.; Wang, Y.-H.; Chen, A.; Chang, K.-J.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:53Z |
Manufacturing Parameters Optimization in Functional Textile Dyeing Processes
|
Hong, I.-H.; Shen, Z.; Chen, S.-C.; Chen, A.; Tsai, K.-C.; Lin, Y.-T.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:53Z |
Quantitative analysis of echogenicity for patients with thyroid nodules
|
Chen, C.-N.; Chen, K.-Y.; Ho, M.-C.; Tai, H.-C.; Wang, Y.-H.; Chen, A.; Chang, K.-J.; ARGON CHEN; Wu, M.-H. |
| 臺大學術典藏 |
2020-03-02T06:39:52Z |
A Variance-reduction Approach to Detection of the Thyroid-nodule Boundary on Ultrasound Images
|
Chiu, L.-Y.; Chen, A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:52Z |
Ultrasonographic features for differentiating follicular thyroid carcinoma and follicular adenoma
|
ARGON CHEN;Chen, C.-N.;Chen, A.;Hsieh, M.-S.;Chen, K.-Y.;Wu, M.-H.;Kuo, T.-C.; Kuo, T.-C.; Wu, M.-H.; Chen, K.-Y.; Hsieh, M.-S.; Chen, A.; Chen, C.-N.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:52Z |
Equipment Deterioration Modeling and Causes Diagnosis in Semiconductor Manufacturing
|
Rostami, H.; Blue, J.; Chen, A.; Yugma, C.; ARGON CHEN |
| 臺大學術典藏 |
2018-09-10T06:04:34Z |
Sensitivity Analysis of a Quadratic Goal Programming Model for Semiconductor Supply Chain
|
David M. Chiang;Ruey-Shan Guo;Argon Chen;Cheng-Bang Chen; David M. Chiang; Ruey-Shan Guo; Argon Chen; Cheng-Bang Chen; MING-HUANG CHIANG |
| 臺大學術典藏 |
2013 |
Quantitative analysis of dynamic power doppler sonograms for patients with thyroid nodules
|
Wu, M.-H.; Chen, C.-N.; Chen, K.-Y.; Ho, M.-C.; Tai, H.-C.; Chung, Y.-C.; Lo, C.-P.; Chen, A.; Chang, K.-J.; ARGON CHEN |
| 元智大學 |
2007-06 |
Design of Optimization-Tool Benchmark System for Continuous Improvements of Semiconductor Manufacturing
|
范治民; Jakey Lan; Shi-Chung Chang; Da-Yin Liao; Argon Chen; Yon-Chun Chou |
| 元智大學 |
2005-12 |
Design and Development of Benchmark Environment and Optimization Tools for 300mm Foundry Manufacturing Service
|
范治民; Jakey Lan; Shi-Chung CHang; Da-Yin Liao; Argon Chen; Yon-Chun Chou |
