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机构 日期 题名 作者
臺大學術典藏 2020-03-02T06:40:00Z Optimal levels of process parameters for products with multiple characteristics Elsayed, E.A.; Chen, A.; ARGON CHEN
臺大學術典藏 2020-03-02T06:40:00Z Applications of quantitative methods in semiconductor manufacturing Moench, Lars; Chen, Argon; Ham, Andy; Morrison, James; ARGON CHEN
臺大學術典藏 2020-03-02T06:39:59Z A self-tuning run-by-run process controller for processes subject to random disturbances Guo, R.-S.; Chen, J.-J.; Chen, A.; Lu, S.-S.; ARGON CHEN
臺大學術典藏 2020-03-02T06:39:59Z Run-to-run control schemes for CMP process subject to deterministic drifts Guo, R.-S.; Chen, A.; Chen, J.-J.; ARGON CHEN
臺大學術典藏 2020-03-02T06:39:59Z An effective SPC approach to monitoring semiconductor quality data with multiple variation sources Chen, A.; Guo, R.-S.; Yeh, P.-C.; ARGON CHEN
臺大學術典藏 2020-03-02T06:39:59Z Function-based cost modeling for wafer manufacturing and its application to strategic management Guo, R.-S.; Chen, A.; Lin, P.-L.; Shih, Y.-C.; ARGON CHEN
臺大學術典藏 2020-03-02T06:39:59Z Modeling and optimization of wafer-level spatial uniformity with the use of rational subgrouping Guo, R.-S.; Chen, A.; Liu, C.; Lin, A.; Lan, M.; ARGON CHEN
臺大學術典藏 2020-03-02T06:39:58Z Age-based double EWMA controller and its application to a CMP process Chen, A.; Guo, R.-S.; ARGON CHEN
臺大學術典藏 2020-03-02T06:39:58Z Recipe-independent tool health indicator and fault prognosis Chen, A.; Blue, J.; Chou, T.-C.; Yang, T.-K.; ARGON CHEN
臺大學術典藏 2020-03-02T06:39:58Z A quadratic goal programming model and sensitivity analysis for semiconductor supply chain Chiang, D.; Guo, R.-S.; Chen, A.; Chen, C.-B.; ARGON CHEN

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