|
|
Taiwan Academic Institutional Repository >
Browse by Author
|
"chung steve s"
Showing items 11-20 of 136 (14 Page(s) Totally)
<< < 1 2 3 4 5 6 7 8 9 10 > >>
View [10|25|50] records per page
| 國立交通大學 |
2019-04-02T06:04:37Z |
Experimental Observation on the Random Dopant Fluctuation of Small Scale Trigate CMOS Devices
|
Chung, Steve S. |
| 國立交通大學 |
2019-04-02T06:04:27Z |
Resistive Switching Non-volatile Memory Feasible for 28nm and Beyond Embedded Logic CMOS Technology
|
Chung, Steve S. |
| 國立交通大學 |
2019-04-02T06:04:26Z |
A Novel ReWritable One-Time-Programming OTP (RW-OTP) Realized by Dielectric-fuse RRAM Devices Featuring Ultra-High Reliable Retention and Good Endurance for Embedded Applications
|
Cheng, H. W.; Hsieh, E. R.; Huang, Z. H.; Chuang, C. H.; Chen, C. H.; Li, F. L.; Lo, Y. M.; Liu, C. H.; Chung, Steve S. |
| 國立交通大學 |
2019-04-02T06:00:32Z |
The investigation of charge loss mechanism in a two-bit wrapped-gate nitride storage nonvolatile memory
|
Ho, Y. H.; Chung, Steve S.; Chen, H. H. |
| 國立交通大學 |
2019-04-02T05:58:37Z |
An Experimental Approach to Characterizing the Channel Local Temperature Induced by Self-Heating Effect in FinFET
|
Hsieh, E. Ray; Jiang, Meng-Ru; Lin, Jian-Li; Chung, Steve S.; Chen, Tse Pu; Huang, Shih An; Chen, Tai-Ju; Cheng, Osbert |
| 國立交通大學 |
2018-08-21T05:57:09Z |
The Issues on the Power Consumption of Trigate FinFET: The Design and Manufacturing Guidelines
|
Chung, Steve S.; Hsieh, E. R. |
| 國立交通大學 |
2018-08-21T05:57:09Z |
The Impact of TiN Barrier on the NBTI in an Advanced High-k Metal-gate p-channel MOSFET
|
Huang, D. -C.; Hsieh, E. Ray; Gong, J.; Huang, C. -F.; Chung, Steve S. |
| 國立交通大學 |
2018-08-21T05:57:00Z |
The Guideline on Designing Face-tunneling FET for Large-scale-device Applications in IoT
|
Hsieh, E. R.; Lee, J. W.; Lee, M. H.; Chung, Steve S. |
| 國立交通大學 |
2018-08-21T05:56:52Z |
A Novel Design of P-N Staggered Face-tunneling TFET Targeting for Low Power and Appropriate Performance Applications
|
Hsieh, E. R.; Fan, Y. C.; Chang, K. Y.; Liu, C. H.; Chien, C. H.; Chung, Steve S. |
| 國立交通大學 |
2018-08-21T05:56:52Z |
Geometric Variation: A Novel Approach to Examine the Surface Roughness and the Line Roughness Effects in Trigate FinFETs
|
Hsieh, E. R.; Fan, Y. C.; Liu, C. H.; Chung, Steve S.; Huang, R. M.; Tsai, C. T.; Yew, T. R. |
Showing items 11-20 of 136 (14 Page(s) Totally)
<< < 1 2 3 4 5 6 7 8 9 10 > >>
View [10|25|50] records per page
|
