English  |  正體中文  |  简体中文  |  Total items :0  
Visitors :  51507209    Online Users :  777
Project Commissioned by the Ministry of Education
Project Executed by National Taiwan University Library
 
臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
About TAIR

Browse By

News

Copyright

Related Links

"chung steve s"

Return to Browse by Author
Sorting by Title Sort by Date

Showing items 41-50 of 136  (14 Page(s) Totally)
<< < 1 2 3 4 5 6 7 8 9 10 > >>
View [10|25|50] records per page

Institution Date Title Author
國立交通大學 2017-04-21T06:48:48Z 3D-TCAD Simulation Study of the Contact All Around T-FinFET Structure for 10nm Metal-Oxide-Semiconductor Field-Effect Transistor Chou, Chen-Han; Hsu, Chung-Chun; Yeh, Wen-Kuan; Chung, Steve S.; Chien, Chao-Hsin
國立交通大學 2017-04-21T06:48:46Z A Novel One Transistor Non-volatile Memory Feasible for NOR and NAND Applications in IoT Era Chung, Steve S.; Hsieh, E. R.; Yang, S. P.; Chuang, C. H.
國立交通大學 2017-04-21T06:48:32Z Demonstration of 3D Vertical RRAM with Ultra Low-leakage, High-selectivity and Self-compliance Memory Cells Luo, Qing; Xu, Xiaoxin; Liu, Hongtao; Lv, Hangbing; Gong, Tiancheng; Long, Shibing; Liu, Qi; Sun, Haitao; Banerjee, Writam; Li, Ling; Gao, Jianfeng; Lu, Nianduan; Chung, Steve S.; Li, Jing; Liu, Ming
國立交通大學 2017-04-21T06:48:18Z The Demonstration of Low-cost and Logic Process Fully-Compatible OTP Memory on Advanced HKMG CMOS with a Newly found Dielectric Fuse Breakdown Hsieh, E. R.; Huang, Z. H.; Chung, Steve S.; Ke, J. C.; Yang, C. W.; Tsai, C. T.; Yew, T. R.
國立交通大學 2017-04-21T06:48:17Z High Performance Design of Tunneling FET for Low Voltage/Power Applications: Strategies and Solutions Chung, Steve S.
國立交通大學 2016-03-29T00:01:14Z 低功耗互補式穿隧場效電晶體的設計與製作 (I) 莊紹勳; Chung Steve S
國立交通大學 2016-03-28T08:17:32Z 高性能先進三維閘極CMOS應變元件設計-元件至電路的考量( III ) 莊紹勳; Chung Steve S
國立交通大學 2016-03-28T08:17:22Z 低功耗互補式穿隧場效電晶體的設計與製作 (I) 莊紹勳; Chung Steve S
國立交通大學 2016-03-28T00:04:19Z The understanding on the evolution of stress-induced gate leakage in high-k dielectric metal-oxide-field-effect transistor by random-telegraph-noise measurement Hsieh, E. R.; Chung, Steve S.
國立交通大學 2015-12-02T03:00:54Z The Observation of BTI-induced RTN Traps in Inversion and Accumulation Modes on HfO2 High-k Metal Gate 28nm CMOS Devices Wu, P. C.; Hsieh, E. R.; Lu, P. Y.; Chung, Steve S.; Chang, K. Y.; Liu, C. H.; Ke, J. C.; Yang, C. W.; Tsai, C. T.

Showing items 41-50 of 136  (14 Page(s) Totally)
<< < 1 2 3 4 5 6 7 8 9 10 > >>
View [10|25|50] records per page