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"chung steve s"的相关文件
显示项目 111-120 / 136 (共14页)
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| 國立交通大學 |
2014-12-08T15:45:54Z |
The Observation of Trapping and Detrapping Effects in High-k Gate Dielectric MOSFETs by a New Gate Current Random Telegraph Noise (I(G)-RTN) Approach
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Chang, C. M.; Chung, Steve S.; Hsieh, Y. S.; Cheng, L. W.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W. |
| 國立交通大學 |
2014-12-08T15:45:53Z |
More Strain and Less Stress- The Guideline for Developing High-End Strained CMOS Technologies with Acceptable Reliability
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Chung, Steve S.; Hsieh, E. R.; Huang, D. C.; Lai, C. S.; Tsai, C. H.; Liu, P. W.; Lin, Y. H.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W. |
| 國立交通大學 |
2014-12-08T15:39:25Z |
The Understanding of Strain-Induced Device Degradation in Advanced MOSFETs with Process-Induced Strain Technology of 65nm Node and Beyond
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Lin, M. H.; Hsieh, E. R.; Chung, Steve S.; Tsai, C. H.; Liu, P. W.; Lin, Y. H.; Tsai, C. T.; Ma, G. H. |
| 國立交通大學 |
2014-12-08T15:36:22Z |
The understanding of the drain-current fluctuation in a silicon-carbon source-drain strained n-channel metal-oxide-semiconductor field-effect transistors
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Hsieh, E. R.; Chung, Steve S. |
| 國立交通大學 |
2014-12-08T15:33:48Z |
The Variability Issues in Small Scale Trigate CMOS Devices: Random Dopant and Trap Induced Fluctuations
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Chung, Steve S. |
| 國立交通大學 |
2014-12-08T15:33:16Z |
Experimental Observation on the Random Dopant Fluctuation of Small Scale Trigate CMOS Devices
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Chung, Steve S. |
| 國立交通大學 |
2014-12-08T15:32:43Z |
The Understanding of the Bulk Trigate MOSFET's Reliability Through the Manipulation of RTN Traps
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Hsieh, E. R.; Wu, P. C.; Chung, Steve S.; Tsai, C. H.; Huang, R. M.; Tsai, C. T. |
| 國立交通大學 |
2014-12-08T15:32:12Z |
The Physical Insights Into an Abnormal Erratic Behavior in the Resistance Random Access Memory
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Huang, Y. J.; Chung, Steve S.; Lee, H. Y.; Chen, Y. S.; Chen, F. T.; Gu, P. Y.; Tsai, M. -J. |
| 國立交通大學 |
2014-12-08T15:30:46Z |
The Understanding of Multi-level RTN in Trigate MOSFETs Through the 2D Profiling of Traps and Its Impact on SRAM Performance: A New Failure Mechanism Found
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Hsieh, E. R.; Tsai, Y. L.; Chung, Steve S.; Tsai, C. H.; Huang, R. M.; Tsai, C. T. |
| 國立交通大學 |
2014-12-08T15:29:05Z |
Low Voltage and High Speed SONOS Flash Memory Technology: The Strategies and the Reliabilities
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Chung, Steve S. |
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