臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

關於TAIR
	計畫說明

瀏覽
	典藏機構
	作者
	題名
	日期
	統計圖表
	機構即時統計
	學術趨勢

消息
	2019臺灣學術機構典藏研討會
	機構典藏系統RC7版本已發佈

著作權
	出版社及期刊政策查詢
	TAIR著作權會議記錄

相關連結
	機構典藏計畫網站
	ROAR
	OpenDOAR
	SHERPA
	OAIster
	JAIRO
	Ira
	DSPACE
	RWWR
	臺大學術典藏NTU Scholars

"chung steve s"的相關文件

回到依作者瀏覽
依題名排序	依日期排序

顯示項目 111-135 / 136 (共6頁)
<< < 1 2 3 4 5 6 > >>
每頁顯示[10|25|50]項目

機構	日期	題名	作者
國立交通大學	2014-12-08T15:45:54Z	The Observation of Trapping and Detrapping Effects in High-k Gate Dielectric MOSFETs by a New Gate Current Random Telegraph Noise (I(G)-RTN) Approach	Chang, C. M.; Chung, Steve S.; Hsieh, Y. S.; Cheng, L. W.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W.
國立交通大學	2014-12-08T15:45:53Z	More Strain and Less Stress- The Guideline for Developing High-End Strained CMOS Technologies with Acceptable Reliability	Chung, Steve S.; Hsieh, E. R.; Huang, D. C.; Lai, C. S.; Tsai, C. H.; Liu, P. W.; Lin, Y. H.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W.
國立交通大學	2014-12-08T15:39:25Z	The Understanding of Strain-Induced Device Degradation in Advanced MOSFETs with Process-Induced Strain Technology of 65nm Node and Beyond	Lin, M. H.; Hsieh, E. R.; Chung, Steve S.; Tsai, C. H.; Liu, P. W.; Lin, Y. H.; Tsai, C. T.; Ma, G. H.
國立交通大學	2014-12-08T15:36:22Z	The understanding of the drain-current fluctuation in a silicon-carbon source-drain strained n-channel metal-oxide-semiconductor field-effect transistors	Hsieh, E. R.; Chung, Steve S.
國立交通大學	2014-12-08T15:33:48Z	The Variability Issues in Small Scale Trigate CMOS Devices: Random Dopant and Trap Induced Fluctuations	Chung, Steve S.
國立交通大學	2014-12-08T15:33:16Z	Experimental Observation on the Random Dopant Fluctuation of Small Scale Trigate CMOS Devices	Chung, Steve S.
國立交通大學	2014-12-08T15:32:43Z	The Understanding of the Bulk Trigate MOSFET's Reliability Through the Manipulation of RTN Traps	Hsieh, E. R.; Wu, P. C.; Chung, Steve S.; Tsai, C. H.; Huang, R. M.; Tsai, C. T.
國立交通大學	2014-12-08T15:32:12Z	The Physical Insights Into an Abnormal Erratic Behavior in the Resistance Random Access Memory	Huang, Y. J.; Chung, Steve S.; Lee, H. Y.; Chen, Y. S.; Chen, F. T.; Gu, P. Y.; Tsai, M. -J.
國立交通大學	2014-12-08T15:30:46Z	The Understanding of Multi-level RTN in Trigate MOSFETs Through the 2D Profiling of Traps and Its Impact on SRAM Performance: A New Failure Mechanism Found	Hsieh, E. R.; Tsai, Y. L.; Chung, Steve S.; Tsai, C. H.; Huang, R. M.; Tsai, C. T.
國立交通大學	2014-12-08T15:29:05Z	Low Voltage and High Speed SONOS Flash Memory Technology: The Strategies and the Reliabilities	Chung, Steve S.
國立交通大學	2014-12-08T15:28:53Z	The mechanisms of random trap fluctuation in metal oxide semiconductor field effect transistors	Hsieh, E. R.; Chung, Steve S.
國立交通大學	2014-12-08T15:28:09Z	Extension of Moore's Law Via Strained Technologies-The Strategies and Challenges	Chung, Steve S.
國立交通大學	2014-12-08T15:25:08Z	Reliability issues for high performance nanoscale CMOS technologies with channel mobility enhancing schemes	Chung, Steve S.
國立交通大學	2014-12-08T15:24:57Z	New observations on the uniaxial and biaxial strain-induced hot carrier and NBTI Reliabilities for 65nm node CMOS devices and beyond	Chung, Steve S.; Huang, D. C.; Tsai, Y. J.; Lai, C. S.; Tsai, C. H.; Liu, P. W.; Lin, Y. H.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W.
國立交通大學	2014-12-08T15:24:57Z	Understanding of the leakage components and its correlation to the oxide scaling on the SONOS cell endurance and retention	Chen, C. H.; Chiang, P. Y.; Chung, Steve S.; Chen, Terry; Chou, George C. W.; Chu, C. H.
國立交通大學	2014-12-08T15:22:00Z	A New Observation of Strain-Induced Slow Traps in Advanced CMOS Technology with Process-Induced Strain Using Random Telegraph Noise Measurement	Lin, M. H.; Hsieh, E. R.; Chung, Steve S.; Tsai, C. H.; Liu, P. W.; Lin, Y. H.; Tsai, C. T.; Ma, G. H.
國立交通大學	2014-12-08T15:21:56Z	Design of High-Performance and Highly Reliable nMOSFETs with Embedded Si:C S/D Extension Stressor(Si:C S/D-E)	Chung, Steve S.; Hsieh, E. R.; Liu, P. W.; Chiang, W. T.; Tsai, S. H.; Tsai, T. L.; Huang, R. M.; Tsai, C. H.; Teng, W. Y.; Li, C. I.; Kuo, T. F.; Wang, Y. R.; Yang, C. L.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W.
國立交通大學	2014-12-08T15:21:21Z	A New and Simple Experimental Approach to Characterizing the Carrier Transport and Reliability of Strained CMOS Devices in the Quasi-Ballistic Regime	Hsieh, E. R.; Chung, Steve S.; Liu, P. W.; Chiang, W. T.; Tsai, C. H.; Teng, W. Y.; Li, C. I.; Kuo, T. F.; Wang, Y. R.; Yang, C. L.; Tsai, C. T.; Ma, G. H.
國立交通大學	2014-12-08T15:20:29Z	New Observations on the Physical Mechanism of Vth-Variation in Nanoscale CMOS Devices After Long Term Stress	Hsieh, E. R.; Chung, Steve S.; Tsai, C. H.; Huang, R. M.; Tsai, C. T.; Liang, C. W.
國立交通大學	2014-12-08T15:16:50Z	The incremental frequency charge pumping method: Extending the CMOS ultra-thin gate oxide measurement down to 1nm	Chung, Steve S.
國立交通大學	2014-12-08T15:10:38Z	The investigation of capture/emission mechanism in high-k gate dielectric soft breakdown by gate current random telegraph noise approach	Chung, Steve S.; Chang, C. M.
國立交通大學	2014-12-08T15:10:03Z	The channel backscattering characteristics of sub-100nm CMOS devices with different channel/substrate orientations	Tsai, Y. J.; Chung, Steve S.; Liu, P. W.; Tsai, C. H.; Lin, Y. H.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W.
國立交通大學	2014-12-08T15:09:24Z	Novel ultra-low voltage and high-speed programming/erasing schemes for SONOS flash memory with excellent data retention	Chung, Steve S.; Tseng, Y. H.; Lai, C. S.; Hsu, Y. Y.; Ho, Eric; Chen, Terry; Peng, L. C.; Chu, C. H.
國立交通大學	2014-12-08T15:07:36Z	Technology roadmaps on the ballistic transport in strain engineered nanoscale CMOS devices	Chung, Steve S.; Tsai, Y. J.; Tsai, C. H.; Liu, P. W.; Lin, Y. H.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W.
國立交通大學	2014-12-08T15:07:17Z	The proximity of the strain induced effect to improve the electron mobility in a silicon-carbon source-drain structure of n-channel metal-oxide-semiconductor field-effect transistors	Hsieh, E. R.; Chung, Steve S.

顯示項目 111-135 / 136 (共6頁)
<< < 1 2 3 4 5 6 > >>
每頁顯示[10|25|50]項目

	English \| 正體中文 \| 简体中文 \| 總筆數 :0
	造訪人次 : 51418012 線上人數 : 736 教育部委託研究計畫計畫執行:國立臺灣大學圖書館