臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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	2019臺灣學術機構典藏研討會
	機構典藏系統RC7版本已發佈

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Institution	Date	Title	Author
國立成功大學	2023	The Impact of Hot Carrier Injection-Induced Device Degradation for Lower-Power FinFETs	Chen, Y.-L.;Yeh, W.-K.;Hsu, Hsu H.-T.;Chen, K.-H.;Lien, D.-H.;Lin, W.-C.;Yu, T.-H.;Chiu, Y.-S.;Godwinraj, D.;Godfrey, D.;Wu, C.-H.

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