|
English
|
正體中文
|
简体中文
|
2817115
|
|
???header.visitor??? :
27654903
???header.onlineuser??? :
612
???header.sponsordeclaration???
|
|
|
|
???tair.name??? >
???browser.page.title.author???
|
"ho i y"???jsp.browse.items-by-author.description???
Showing items 1-2 of 2 (1 Page(s) Totally)
1
View [10|25|50] records per page
| 臺大學術典藏 |
2022-06-30T02:06:08Z |
Oxidation-boosted charge trapping in ultra-sensitive van der Waals materials for artificial synaptic features
|
Yang F.-S.; Li M.; Lee M.-P.; Ho I.-Y.; Chen J.-Y.; Ling H.; Li Y.; Chang J.-K.; Yang S.-H.; Chang Y.-M.; Lee K.-C.; Chou Y.-C.; Ho C.-H.; Li W.; Lien C.-H.; Lin Y.-F.; Yang F.-S.; Chou Y.-C; YI-CHIA CHOU |
| 國立臺灣科技大學 |
2020 |
Oxidation-boosted charge trapping in ultra-sensitive van der Waals materials for artificial synaptic features
|
Yang, F.-S.;Li, M.;Lee, M.-P.;Ho, I.-Y.;Chen, J.-Y.;Ling, H.;Li, Y.;Chang, J.-K.;Yang, S.-H.;Chang, Y.-M.;Lee, K.-C.;Chou, Y.-C.;Ho, C.-H.;Li, W.;Lien, C.-H.;Lin, Y.-F. |
Showing items 1-2 of 2 (1 Page(s) Totally)
1
View [10|25|50] records per page
|
