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Showing items 1-10 of 44  (5 Page(s) Totally)
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Institution Date Title Author
國立交通大學 2019-04-02T05:59:29Z Asymmetric gate capacitance and dynamic characteristic fluctuations in 16 nm bulk MOSFETs due to random distribution of discrete dopants Lee, Kuo-Fu; Li, Yiming; Hwang, Chih-Hong
國立交通大學 2014-12-12T02:31:23Z 具立體通道之矽奈米級金氧半場效應電晶體本質參數擾動之研究 黃至鴻; Hwang, Chih-Hong; 李義明; Li, Yiming
國立交通大學 2014-12-08T15:48:22Z Asymmetric Gate Capacitance and High Frequency Characteristic Fluctuations in 16 nm Bulk MOSFETs Due to Random Distribution of Discrete Dopants Li, Yiming; Hwang, Chih-Hong; Yeh, Ta-Ching
國立交通大學 2014-12-08T15:43:49Z Discrete-dopant-fluctuated threshold voltage roll-off in sub-16 nm bulk fin-type field effect transistors Li, Yiming; Hwang, Chih-Hong
國立交通大學 2014-12-08T15:43:31Z Large-scale "atomistic" approach to discrete-dopant-induced characteristic fluctuations in silicon nanowire transistors Li, Yiming; Hwang, Chih-Hong; Huang, Hsuan-Ming
國立交通大學 2014-12-08T15:40:40Z Discrete-Dopant-Fluctuated Transient Behavior and Variability Suppression in 16-nm-Gate Complementary Metal-Oxide-Semiconductor Field-Effect Transistors Li, Yiming; Hwang, Chih-Hong; Cheng, Hui-Wen
國立交通大學 2014-12-08T15:28:22Z Temperature dependence on the contact size of GeSbTe films for phase change memories Li, Yiming; Yu, Shao-Ming; Hwang, Chih-Hong; Kuo, Yi-Ting
國立交通大學 2014-12-08T15:25:39Z Statistical Analysis of Metal Gate Workfunction Variability, Process Variation, and Random Dopant Fluctuation in Nano-CMOS Circuits Hwang, Chih-Hong; Li, Tien-Yeh; Han, Ming-Hung; Lee, Kuo-Fu; Cheng, Hui-Wen; Li, Yiming
國立交通大學 2014-12-08T15:24:49Z Process-Variation- and Random-Dopant-Induced Static Noise Margin Fluctuation in Nanoscale CMOS and FinFET SRAM Cells Li, Tien-Yeh; Hwang, Chih-Hong; Li, Yiming
國立交通大學 2014-12-08T15:24:48Z Propagation Delay Dependence on Channel Fins and Geometry Aspect Ratio of 16-nm Multi-Gate MOSFET Inverter Cheng, Hui-Wen; Hwang, Chih-Hong; Li, Yiming

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