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"hwang chih hong"的相关文件
显示项目 1-10 / 44 (共5页)
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| 國立交通大學 |
2019-04-02T05:59:29Z |
Asymmetric gate capacitance and dynamic characteristic fluctuations in 16 nm bulk MOSFETs due to random distribution of discrete dopants
|
Lee, Kuo-Fu; Li, Yiming; Hwang, Chih-Hong |
| 國立交通大學 |
2014-12-12T02:31:23Z |
具立體通道之矽奈米級金氧半場效應電晶體本質參數擾動之研究
|
黃至鴻; Hwang, Chih-Hong; 李義明; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:48:22Z |
Asymmetric Gate Capacitance and High Frequency Characteristic Fluctuations in 16 nm Bulk MOSFETs Due to Random Distribution of Discrete Dopants
|
Li, Yiming; Hwang, Chih-Hong; Yeh, Ta-Ching |
| 國立交通大學 |
2014-12-08T15:43:49Z |
Discrete-dopant-fluctuated threshold voltage roll-off in sub-16 nm bulk fin-type field effect transistors
|
Li, Yiming; Hwang, Chih-Hong |
| 國立交通大學 |
2014-12-08T15:43:31Z |
Large-scale "atomistic" approach to discrete-dopant-induced characteristic fluctuations in silicon nanowire transistors
|
Li, Yiming; Hwang, Chih-Hong; Huang, Hsuan-Ming |
| 國立交通大學 |
2014-12-08T15:40:40Z |
Discrete-Dopant-Fluctuated Transient Behavior and Variability Suppression in 16-nm-Gate Complementary Metal-Oxide-Semiconductor Field-Effect Transistors
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Li, Yiming; Hwang, Chih-Hong; Cheng, Hui-Wen |
| 國立交通大學 |
2014-12-08T15:28:22Z |
Temperature dependence on the contact size of GeSbTe films for phase change memories
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Li, Yiming; Yu, Shao-Ming; Hwang, Chih-Hong; Kuo, Yi-Ting |
| 國立交通大學 |
2014-12-08T15:25:39Z |
Statistical Analysis of Metal Gate Workfunction Variability, Process Variation, and Random Dopant Fluctuation in Nano-CMOS Circuits
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Hwang, Chih-Hong; Li, Tien-Yeh; Han, Ming-Hung; Lee, Kuo-Fu; Cheng, Hui-Wen; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:24:49Z |
Process-Variation- and Random-Dopant-Induced Static Noise Margin Fluctuation in Nanoscale CMOS and FinFET SRAM Cells
|
Li, Tien-Yeh; Hwang, Chih-Hong; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:24:48Z |
Propagation Delay Dependence on Channel Fins and Geometry Aspect Ratio of 16-nm Multi-Gate MOSFET Inverter
|
Cheng, Hui-Wen; Hwang, Chih-Hong; Li, Yiming |
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