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教育部委託研究計畫      計畫執行:國立臺灣大學圖書館
 
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機構 日期 題名 作者
國立高雄師範大學 2002 Effect of Mechanical Stress on the Characteristics of Silicon Thermal Oxides Chia-Hong Huang;Jui-Yuan Yen;Jenn-Gwo Hwu; 黃嘉宏
國立高雄師範大學 2001 Breakdown Characteristics of Ultra-thin Gate Oxide ( < 4nm ) in MOS Structure Subjected Substrate Injection Chia-Hong Huang;Jenn-Gwo Hwu; 黃嘉宏
國立高雄師範大學 2001 Anomalous Low-Voltage Tunneling Current ( LVTC ) Characteristics of Ultra-Thin Gate Oxide ( ~2nm ) after High Field Stress Chia-Hong Huang;Jenn-Gwo Hwu; 黃嘉宏
臺大學術典藏 2001 Anomalous low-voltage tunneling current characteristics of ultrathin gate oxide (∼2 nm) after high-field stress JENN-GWO HWU; Hwu, J.-G.; Huang, C.-H.
臺大學術典藏 2001 An on-chip temperature sensor by utilizing a MOS tunneling diode Shih, Y.-H.; Hwu, J.-G.; JENN-GWO HWU
國立高雄師範大學 2000 Enhancement in Soft Breakdown Occurrence on Ultra-thin Gate Oxides Caused by Photon Effect in Rapid Thermal Post Oxidation Annealing Chia-Hong Huang;Jenn-Gwo Hwu; 黃嘉宏
國立高雄師範大學 2000 Role of Interface Trap Generation in the Low-Voltage Tunneling Current ( LVTC ) Characteristics of Ultra-Thin Gate Oxide ( ~2nm ) under High Field Stress Chia-Hong Huang;Jenn-Gwo Hwu; 黃嘉宏
國立高雄師範大學 1999 The Breakdown Properties of Front- and Back-side Post Oxidation Annealed( POA ) Ultrathin Gate Oxide ( <3nm ) under High Field Stress Chia-Hong Huang;Jenn-Gwo Hwu; 黃嘉宏
臺大學術典藏 1996 Reliable fluorinated thin gate oxides prepared by liquid phase deposition following rapid thermal process JENN-GWO HWU; Hwu, J.-G.; Lu, W.-S.; Lu, W.-S.;Hwu, J.-G.

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