|
English
|
正體中文
|
简体中文
|
Total items :2815035
|
|
Visitors :
27366239
Online Users :
579
Project Commissioned by the Ministry of Education
Project Executed by National Taiwan University Library
|
|
|
|
Taiwan Academic Institutional Repository >
Browse by Author
|
"lee jeng han"
Showing items 1-8 of 8 (1 Page(s) Totally)
1
View [10|25|50] records per page
| 國立交通大學 |
2018-08-21T05:56:47Z |
Dynamic ink-jet printing analysis system with addressable waveform trimming
|
Huang, Chieh-Yi; Shang, Kuo-Chiang; Wu, Kuo-Hua; Lee, Jeng-Han; Liu, Tsu-Min; Cheng, Kevin; Wu, Bing-Fei |
| 國立交通大學 |
2018-08-21T05:56:33Z |
Surface Potential and Electric Field Mapping of p-well/n-well Junction by Secondary Electron Potential Contrast and in-situ Nanoprobe biasing
|
Lee, Jeng-Han; Liu, Po-Tsun; Wang, M. H.; Lin, Y. T.; Huan, Y. S.; Su, David |
| 國立交通大學 |
2014-12-12T01:25:21Z |
二次電子電壓對比應用於摻雜分佈與缺陷定位之研究
|
李正漢; Lee, Jeng-Han; 劉柏村; Liu, Po-Tsun |
| 國立交通大學 |
2014-12-08T15:31:02Z |
Profiling p(+)/n-Well Junction by Nanoprobing and Secondary Electron Potential Contrast
|
Liu, Po-Tsun; Lee, Jeng-Han |
| 國立交通大學 |
2014-12-08T15:26:33Z |
Inspection of the Current-Mirror Mismatch by Secondary Electron Potential Contrast With In Situ Nanoprobe Biasing
|
Liu, Po-Tsun; Lee, Jeng-Han |
| 國立交通大學 |
2014-12-08T15:23:06Z |
Surface potential mapping of p(+)/n-well junction by secondary electron potential contrast with in situ nano-probe biasing
|
Lee, Jeng-Han; Liu, Po-Tsun |
| 國立交通大學 |
2014-12-08T15:08:42Z |
Application of secondary electron potential contrast on junction leakage isolation
|
Liu, Po-Tsun; Lee, Jeng-Han; Huan, Y. S.; Su, David |
| 國立臺灣大學 |
2008 |
Uniform Square Polycrystalline Silicon Fabricated by Employing Periodic Metallic Pads and SiON Absorption Layer for Thin Film Transistors
|
Yang, Po-Chuan; Hsueh, Chun-Yuan; Yang, Chieh-Hung; Lee, Jeng-Han; Lin, Hui-Wen; Chang, Hsu-Yu; Chang, Chi-Yang; Lee, Si-Chen |
Showing items 1-8 of 8 (1 Page(s) Totally)
1
View [10|25|50] records per page
|
