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Institution Date Title Author
國立臺灣大學 2008 Simultaneous capture and shift power reduction test pattern generator for scan testing Lin, H.-T.; Li, J.C.-M.
國立臺灣大學 2008 Effective and Economic Phase Noise Testing for Single-Chip TV Tuners Li, J. C.-M.; Lin, P.-C.; Chiang, P.-C.; Pan, C.-M.; Tseng, C.W.
國立臺灣大學 2008 Survey of Scan Chain Diagnosis Huang, Y.; Guo, R; Cheng, W.T.; Li, J. C.-M.
國立臺灣大學 2005-11 Column parity and row selection (CPRS): a BIST diagnosis technique for multiple errors in multiple scan chains Lin, Hung-Mao; Li, J.C.M.
國立臺灣大學 2005-05 Jump scan: a DFT technique for low power testing Chiu, Min-Hao; Li, J.C.M.

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