| 臺大學術典藏 |
2018-09-10T07:36:19Z |
Very-low-voltage testing of amorphous silicon TFT circuits
|
Shen, S.-T.;Liu, W.-H.;Ma, E.-H.;Li, J.C.-M.;Cheng, I.-C.; Shen, S.-T.; Liu, W.-H.; Ma, E.-H.; Li, J.C.-M.; Cheng, I.-C.; I-CHUN CHENG |
| 臺大學術典藏 |
2018-09-10T05:29:21Z |
Diagnosis of Single stuck-at Faults and Multiple Timing Faults in Scan Chains
|
Li, J. C.-M.; CHIEN-MO LI |
| 臺大學術典藏 |
2018-09-10T05:29:21Z |
Diagnosis of Resistive and Stuck-open Defects in Digital CMOS IC
|
Li, J. C.-M.; E. J. McCluskey; CHIEN-MO LI |
| 臺大學術典藏 |
2018-09-10T05:29:21Z |
Diagnosis of Multiple Hold-time and Setup-time Faults in Scan Chains
|
Li, J. C. M.; CHIEN-MO LI |
| 臺大學術典藏 |
2018-09-10T04:59:51Z |
A Design for Testability Technique for Low Power Delay Fault Testing
|
Li, J. C. M.; CHIEN-MO LI |
| 臺大學術典藏 |
2018-09-10T04:15:41Z |
Diagnosis for Sequence Dependent Chips
|
Li, J. C.M.; E. J. McCluskey; CHIEN-MO LI |
| 臺大學術典藏 |
2018-09-10T03:50:57Z |
Testing for Resistive and Stuck Opens
|
Li, J. C.M.; Tseng, C.W.; E.J. McCluskey; CHIEN-MO LI |
| 臺大學術典藏 |
2018-09-10T03:50:57Z |
Diagnosis of Tunneling Opens
|
Li, J. C.M.; E.J. McCluskey; CHIEN-MO LI |
| 國立臺灣大學 |
2010 |
DFT and Minimum Leakage Pattern Generation for Static Power Reduction During Test and Burn-in
|
Kao, Wei-Chung; Chuang, Wei-Shun; Lin, Hsiu-Ting; Li, J.C.-M.; Manquinho, V. |
| 國立臺灣大學 |
2009 |
Time-space test response compaction and diagnosis based on BCH codes
|
Wang, F.-M.; Wang, W.-C.; Li, J.C.-M. |
| 國立臺灣大學 |
2008 |
Simultaneous capture and shift power reduction test pattern generator for scan testing
|
Lin, H.-T.; Li, J.C.-M. |
| 國立臺灣大學 |
2008 |
Effective and Economic Phase Noise Testing for Single-Chip TV Tuners
|
Li, J. C.-M.; Lin, P.-C.; Chiang, P.-C.; Pan, C.-M.; Tseng, C.W. |
| 國立臺灣大學 |
2008 |
Survey of Scan Chain Diagnosis
|
Huang, Y.; Guo, R; Cheng, W.T.; Li, J. C.-M. |
| 國立臺灣大學 |
2005-11 |
Column parity and row selection (CPRS): a BIST diagnosis technique for multiple errors in multiple scan chains
|
Lin, Hung-Mao; Li, J.C.M. |
| 國立臺灣大學 |
2005-05 |
Jump scan: a DFT technique for low power testing
|
Chiu, Min-Hao; Li, J.C.M. |
