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Showing items 36-40 of 40 (2 Page(s) Totally)
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| 國立臺灣大學 |
2008 |
Simultaneous capture and shift power reduction test pattern generator for scan testing
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Lin, H.-T.; Li, J.C.-M. |
| 國立臺灣大學 |
2008 |
Effective and Economic Phase Noise Testing for Single-Chip TV Tuners
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Li, J. C.-M.; Lin, P.-C.; Chiang, P.-C.; Pan, C.-M.; Tseng, C.W. |
| 國立臺灣大學 |
2008 |
Survey of Scan Chain Diagnosis
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Huang, Y.; Guo, R; Cheng, W.T.; Li, J. C.-M. |
| 國立臺灣大學 |
2005-11 |
Column parity and row selection (CPRS): a BIST diagnosis technique for multiple errors in multiple scan chains
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Lin, Hung-Mao; Li, J.C.M. |
| 國立臺灣大學 |
2005-05 |
Jump scan: a DFT technique for low power testing
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Chiu, Min-Hao; Li, J.C.M. |
Showing items 36-40 of 40 (2 Page(s) Totally)
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