國立成功大學 |
2012-07 |
The performance and fracture mechanism of solder joints under mechanical reliability test
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Jang, Wei-Luen; Wang, Tai-Siang; Lai, Yen-Fen; Lin, Kwang-Lung; Lai, Yi-Shao |
國立成功大學 |
2012-05-01 |
The Pd distribution and Cu flow pattern of the Pd-plated Cu wire bond and their effect on the nanoindentation
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Lin, Yu-Wei; Wang, Ren-You; Ke, Wun-Bin; Wang, I-Sheng; Chiu, Ying-Ta; Lu, Kuo-Chang; Lin, Kwang-Lung; Lai, Yi-Shao |
國立成功大學 |
2012-04 |
The growth of intermetallic compound in Cu/Sn3.5Ag/Au solder joints under current stressing
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Chiu, Tsung-Chieh; Lin, Kwang-Lung |
國立成功大學 |
2012-04 |
Diffusion of Cu and interfacial reactions during reflow of Sn-8.5Zn-0.5Ag-0.01Al-0.1Ga alloy on Ni/Cu substrate
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Mittal, Jagjiwan; Lin, Kwang Lung |
國立成功大學 |
2012-04 |
Nanoscale Electrodeposition of Copper on an AFM Tip and Its Morphological Investigations
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Mohanty, Udit Surya; Chen, S. Y.; Lin, Kwang-Lung |
國立成功大學 |
2012-02-15 |
Dissolution of Sn in a SnPb solder bump under current stressing
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Chiu, Ying-Ta; Lin, Kwang-Lung; Lai, Yi-Shao |
國立成功大學 |
2012 |
A novel high speed impact testing method for evaluating the low temperature effects of eutectic and lead-free solder joints
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Liu, De-Shin; Hsu, Chang-Lin; Kuo, Chia-Yuan; Huang, Ya-Ling; Lin, Kwang-Lung; Shen, Geng-Shin |
國立成功大學 |
2011-11 |
The formation of electric circuits with carbon nanotubes and copper using tin solder
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Mittal, Jagjiwan; Lin, Kwang Lung |
國立成功大學 |
2011-10 |
Supersaturation induced by current stressing
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Chiu, Ying-Ta; Liu, Chia-Hao; Lin, Kwang-Lung; Lai, Yi-Shao |
國立成功大學 |
2011-08 |
Electromigration-induced microstructural evolution in lead-free and lead-tin solders
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Lin, Kwang-Lung |
國立成功大學 |
2011-06-01 |
Effect of thermal cycling on the adhesion strength of Ti/Ni/Ag films on AlN substrate
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Jang, Wei-Luen; Chiu, Tsung-Chieh; Lin, Kwang-Lung |
國立成功大學 |
2011-05-18 |
The interfacial amorphous double layer and the homogeneous nucleation in reflow of a Sn-Zn solder on Cu substrate
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Pan, Chien-Cheng;Lin, Kwang-Lung |
國立成功大學 |
2009-12 |
The difference in the types of intermetallic compound formed between the cathode and anode of an Sn-Ag-Cu solder joint under current stressing
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Chiu, Tsung-Chieh; Lin, Kwang-Lung |
國立成功大學 |
2009-12 |
Diffusion Behavior of Zn During Reflow of Sn-9Zn Solder on Ni/Cu Substrate
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Mittal, Jagjiwan; Kuo, Shih-Ming; Lin, Yu-Wei; Lin, Kwang-Lung |
國立成功大學 |
2009-07-15 |
Recrystallization under electromigration of a solder alloy
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Kuo, Shih-Ming; Lin, Kwang-Lung |
國立成功大學 |
2009-06 |
The growth of Sn whiskers with dislocation inclusion upon electromigration through a Cu/Sn3.5Ag/Au solder joint
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Chiu, Tsung-Chieh; Lin, Kwang-Lung |
國立成功大學 |
2009-02-05 |
Microstructural evolution of epsilon-AgZn3 and eta-Zn phases in Sn-8.5Zn-0.5Ag-0.01Al-0.1Ga solder during aging treatment
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Hsuan, Teng-Chun; Lin, Kwang-Lung |
國立成功大學 |
2009-02 |
Specific Heat Capacities of Sn-Zn-Based Solders and Sn-Ag-Cu Solders Measured Using Differential Scanning Calorimetry
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Wu, Y. K.; Lin, Kwang-Lung; Salam, B. |
國立成功大學 |
2009-01 |
Suppressing Growth of the Cu5Zn8 Intermetallic Layer in Sn-Zn-Ag-Al-Ga/Cu Solder Joints
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Lai, R. S.; Lin, Kwang-Lung; Salam, B. |
國立成功大學 |
2009 |
Improving high-temperature oxidation behaviour of Sn-Zn-Ag-Al-Ga solders
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Yeh, T. K.; Lin, Kwang-Lung; Salam, B. |
國立成功大學 |
2008-10 |
Electromigration-induced void formation at the Cu5Zn8/solder interface in a Cu/Sn-9Zn/Cu sandwich
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Kuo, Shih-Ming; Lin, Kwang-Lung |
國立成功大學 |
2008-09 |
Electrochemical corrosion behaviour of Pb-free Sn-8.5Zn-0.05Al-XGa and Sn-3Ag-0.5Cu alloys in chloride containing aqueous solution
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Mohanty, Udit Surya; Lin, Kwang-Lung |
國立成功大學 |
2008-08-11 |
The amorphous origin and the nucleation of intermetallic compounds formed at the interface during the soldering of Sn-3.0Ag-0.5Cu on a Cu substrate
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Pan, Chien-Cheng; Yu, Chang-Ho; Lin, Kwang-Lung |
國立成功大學 |
2008-07 |
Orientation transformation of Pb grains in 5Sn-95Pb/63Sn-37Pb composite flip-chip solder joints during electromigration test
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Chiu, Ying-Ta; Lin, Kwang-Lung; Lai, Yi-Shao |
國立成功大學 |
2008-05-29 |
Evolution of interfacial morphology of Sn-8.5Zn-0.5Ag-0.1Al-xGa/Cu system during isothermal aging
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Liu, Nai-Shuo; Lin, Kwang-Lung |