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Institution Date Title Author
國立成功大學 2001-11-01 Electrical properties of TaxNy films by implementing OES in the sputtering system Lu, Yang-Ming; Weng, R. J.; Hwang, Weng-Sing; Yang, Y. S.
國立成功大學 2000-12-01 Qualitative study of beta silicon carbide residual stress by Raman spectroscopy Lu, Yang-Ming; Leu, Ing-Chi
國立成功大學 2000-02-21 Microstructural study of residual stress in chemically vapor deposited beta-SiC Lu, Yang-Ming; Leu, Ing-Chi

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