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Showing items 76-78 of 78  (4 Page(s) Totally)
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Institution Date Title Author
義守大學 2008-12 Investigation on Board-Level CDM ESD Issue in IC Products Ming-Dou Ker;Yuan-Wen Hsiao
義守大學 2008-11 Investigation on Robustness of CMOS Devices Against Cable Discharge Event (CDE) Under Different Layout Parameters in a Deep-Submicrometer CMOS Technology Ming-Dou Ker;Tai-Hsiang Lai
義守大學 2008-11 Investigation and Design of On-Chip Power-Rail ESD Clamp Circuits Without Suffering Latchup-Like Failure During System-Level ESD Test Ming-Dou Ker;Cheng-Cheng Yen

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