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机构 日期 题名 作者
義守大學 2010-06 Design of 2xVDD-Tolerant Power-Rail ESD Clamp Circuit With Consideration of Gate Leakage Current in 65-nm CMOS Technology Chang-Tzu Wang;Ming-Dou Ker
義守大學 2010-05 Circuit and Layout Co-Design for ESD Protection in Bipolar-CMOS-DMOS (BCD) High-Voltage Process Wen-Yi Chen;Ming-Dou Ker
義守大學 2010-02 New Layout Arrangement to Improve ESD Robustness of Large-Array High-Voltage nLDMOS Wen-Yi Chen;Ming-Dou Ker
義守大學 2010-01 Design of 2xVDD-tolerant mixed-voltage I/O buffer against gate-oxide reliability and hot-carrier degradation Hui-Wen Tsai;Ming-Dou Ker
義守大學 2009-09 New layout scheme to improve ESD robustness of I/O buffers in fully-silicided CMOS process Ming-Dou Ker ; Wen-Yi Chen ; Wuu-Trong Shieh ; I-Ju Wei
義守大學 2009-09 Design of Analog Output Buffer With Level Shifting Function on Glass Substrate for Panel Application Tzu-Ming Wang;Ming-Dou Ker;Sao-Chi Chen
義守大學 2009-08 Transient-Induced Latchup in CMOS Integrated Circuits 柯明道;Ming-Dou Ker; Sheng-Fu Hsu
義守大學 2009-08 Transient-to-Digital Converter for System-Level Electrostatic Discharge Protection in CMOS ICs Ming-Dou Ker;Cheng-Cheng Yen
義守大學 2009-08 Impact of Gate Leakage on Performances of Phase-Locked Loop Circuit in Nanoscale CMOS Technology Jung-Sheng Chen;Ming-Dou Ker
義守大學 2009-07 Optimization on MOS-Triggered SCR Structures for On-Chip ESD Protection Shih-Hung Chen;Ming-Dou Ker

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