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Showing items 26-43 of 43  (2 Page(s) Totally)
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Institution Date Title Author
大葉大學 2010-01 Performance improvement in new product development with effective tools and techniques adoption for high-tech industries Yeh, Tsu-Ming;Pai, Fan-Yun;Yang, Ching-Chow
大葉大學 2009-05 The MCDM-based New product development Performance Evaluation and Improvement Model Yeh, Tsu-Ming;Pai, Fan-Yun;Yang, Chien-Hsin
大葉大學 2009-05 Supplier's Use of Power and Buyer's Commitment Pai, Fan-Yun;Yeh, Tsu-Ming
大葉大學 2009-02 Methods for Determining Areas for Improvement Based on the Design of Customer Surveys Yang, Ching-Chow;Yang, King-Jang;Yeh, Tsu-Ming;Pai, Fan-Yun
大葉大學 2008-12 An Investigation of Power-Driven Integration in Buyer-Supplier Relationship Pai, Fan-Yun;Yeh, Tsu-Ming;Huang, Kai-I
大葉大學 2008-10 The impacts of bargaining power and vendor selection practices on performance in supply chain Pai, Fan-Yun;Huang, Kai-I;Yeh, Tsu-Ming
大葉大學 2008-10 The construction of a real-time WIP exception monitoring system for semiconductor industry Yeh, Tsu-Ming;Pai, Fan-Yun;Tsou, Ching-Shih
國立臺灣大學 2008-09 Improved Customer Satisfaction with a Hybrid Dispatching Rule in Semiconductor Back-end Factories Chiang, Ming-Huang; Guo, Ruey-Shan; Pai, Fan-Yun
大葉大學 2008-07 The Exploratory Study of The Utilization And Effectiveness of NPD Tools And Techniques Yeh, Tsu-Ming;Pai, Fan-Yun
大葉大學 2008-02 The analysis of the implementation status of Six Sigma: an empirical study in Taiwan Yang, King-Jang;Yeh, Tsu-Ming;Pai, Fan-Yun;Yang, Ching-Chow
國立臺灣大學 2008 供應鏈廠商間權力與合作行為之研究 白凢芸; Pai, Fan-Yun
大葉大學 2007-10 The Use of Fuzzy Measures in a Performance - Evaluation Model for ERP Implementation among Taiwanese Semiconductor Manufacturers Yang, Ching-Chow;Lin, Wen-Tsann;Pai, Fan-Yun;Yeh, Tsu-Ming
國立臺灣大學 2007 Multi-objectives exception management model for semiconductor back-end environment under turnkey service Guo, Ruey-Shan; Chiang, David M.; Pai, Fan-yun
國立臺灣大學 2007 Evaluating the business value of RFID: Evidence from five case studies Tzeng, Shiou-Fen; Chen, Wun-Hwa; Pai, Fan-Yun
臺大學術典藏 2007 Multi-objectives exception management model for semiconductor back-end environment under turnkey service Guo, Ruey-Shan; Chiang, David M.; Pai, Fan-Yun; Guo, Ruey-Shan; Chiang, David M.; Pai, Fan-yun
臺大學術典藏 2007 Evaluating the business value of RFID: Evidence from five case studies Tzeng, Shiou-Fen; Chen, Wun-Hwa; Pai, Fan-Yun; Tzeng, Shiou-Fen; Chen, Wun-Hwa; Pai, Fan-Yun
國立臺灣大學 2006-02 A WIP-based Exception Management Model for Integrated Circuit Back-end Production Processes Guo, Ruey-Shan; Chiang, David M.; Pai, Fan-Yun
臺大學術典藏 2006-02 A WIP-based Exception Management Model for Integrated Circuit Back-end Production Processes Guo, Ruey-Shan; Chiang, David M.; Pai, Fan-Yun; Guo, Ruey-Shan; Chiang, David M.; Pai, Fan-Yun

Showing items 26-43 of 43  (2 Page(s) Totally)
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