大葉大學 |
2010-01 |
Performance improvement in new product development with effective tools and techniques adoption for high-tech industries
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Yeh, Tsu-Ming;Pai, Fan-Yun;Yang, Ching-Chow |
大葉大學 |
2009-05 |
The MCDM-based New product development Performance Evaluation and Improvement Model
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Yeh, Tsu-Ming;Pai, Fan-Yun;Yang, Chien-Hsin |
大葉大學 |
2009-05 |
Supplier's Use of Power and Buyer's Commitment
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Pai, Fan-Yun;Yeh, Tsu-Ming |
大葉大學 |
2009-02 |
Methods for Determining Areas for Improvement Based on the Design of Customer Surveys
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Yang, Ching-Chow;Yang, King-Jang;Yeh, Tsu-Ming;Pai, Fan-Yun |
大葉大學 |
2008-12 |
An Investigation of Power-Driven Integration in Buyer-Supplier Relationship
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Pai, Fan-Yun;Yeh, Tsu-Ming;Huang, Kai-I |
大葉大學 |
2008-10 |
The impacts of bargaining power and vendor selection practices on performance in supply chain
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Pai, Fan-Yun;Huang, Kai-I;Yeh, Tsu-Ming |
大葉大學 |
2008-10 |
The construction of a real-time WIP exception monitoring system for semiconductor industry
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Yeh, Tsu-Ming;Pai, Fan-Yun;Tsou, Ching-Shih |
國立臺灣大學 |
2008-09 |
Improved Customer Satisfaction with a Hybrid Dispatching Rule in Semiconductor Back-end Factories
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Chiang, Ming-Huang; Guo, Ruey-Shan; Pai, Fan-Yun |
大葉大學 |
2008-07 |
The Exploratory Study of The Utilization And Effectiveness of NPD Tools And Techniques
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Yeh, Tsu-Ming;Pai, Fan-Yun |
大葉大學 |
2008-02 |
The analysis of the implementation status of Six Sigma: an empirical study in Taiwan
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Yang, King-Jang;Yeh, Tsu-Ming;Pai, Fan-Yun;Yang, Ching-Chow |
國立臺灣大學 |
2008 |
供應鏈廠商間權力與合作行為之研究
|
白凢芸; Pai, Fan-Yun |
大葉大學 |
2007-10 |
The Use of Fuzzy Measures in a Performance - Evaluation Model for ERP Implementation among Taiwanese Semiconductor Manufacturers
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Yang, Ching-Chow;Lin, Wen-Tsann;Pai, Fan-Yun;Yeh, Tsu-Ming |
國立臺灣大學 |
2007 |
Multi-objectives exception management model for semiconductor back-end environment under turnkey service
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Guo, Ruey-Shan; Chiang, David M.; Pai, Fan-yun |
國立臺灣大學 |
2007 |
Evaluating the business value of RFID: Evidence from five case studies
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Tzeng, Shiou-Fen; Chen, Wun-Hwa; Pai, Fan-Yun |
臺大學術典藏 |
2007 |
Multi-objectives exception management model for semiconductor back-end environment under turnkey service
|
Guo, Ruey-Shan; Chiang, David M.; Pai, Fan-Yun; Guo, Ruey-Shan; Chiang, David M.; Pai, Fan-yun |
臺大學術典藏 |
2007 |
Evaluating the business value of RFID: Evidence from five case studies
|
Tzeng, Shiou-Fen; Chen, Wun-Hwa; Pai, Fan-Yun; Tzeng, Shiou-Fen; Chen, Wun-Hwa; Pai, Fan-Yun |
國立臺灣大學 |
2006-02 |
A WIP-based Exception Management Model for Integrated Circuit Back-end Production Processes
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Guo, Ruey-Shan; Chiang, David M.; Pai, Fan-Yun |
臺大學術典藏 |
2006-02 |
A WIP-based Exception Management Model for Integrated Circuit Back-end Production Processes
|
Guo, Ruey-Shan; Chiang, David M.; Pai, Fan-Yun; Guo, Ruey-Shan; Chiang, David M.; Pai, Fan-Yun |