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Showing items 41-43 of 43  (2 Page(s) Totally)
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Institution Date Title Author
臺大學術典藏 2007 Evaluating the business value of RFID: Evidence from five case studies Tzeng, Shiou-Fen; Chen, Wun-Hwa; Pai, Fan-Yun; Tzeng, Shiou-Fen; Chen, Wun-Hwa; Pai, Fan-Yun
國立臺灣大學 2006-02 A WIP-based Exception Management Model for Integrated Circuit Back-end Production Processes Guo, Ruey-Shan; Chiang, David M.; Pai, Fan-Yun
臺大學術典藏 2006-02 A WIP-based Exception Management Model for Integrated Circuit Back-end Production Processes Guo, Ruey-Shan; Chiang, David M.; Pai, Fan-Yun; Guo, Ruey-Shan; Chiang, David M.; Pai, Fan-Yun

Showing items 41-43 of 43  (2 Page(s) Totally)
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